共 37 条
[3]
INVESTIGATION OF THE SILICA SURFACE VIA ELECTRON-ENERGY-LOSS SPECTROSCOPY
[J].
PHYSICAL REVIEW B,
1979, 20 (08)
:3446-3455
[4]
OXIDATION UNDER ELECTRON-BOMBARDMENT - A TOOL FOR STUDYING THE INITIAL STATES OF SILICON OXIDATION
[J].
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES,
1987, 55 (06)
:721-733
[7]
CARRIERE B, 1978, J MICROSC SPECT ELEC, V3, P225
[8]
AUGER-ELECTRON SPECTROSCOPY STUDIES OF SILICON-NITRIDE, OXIDE, AND OXYNITRIDE THIN-FILMS - MINIMIZATION OF SURFACE DAMAGE BY ARGON AND ELECTRON-BEAMS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1987, 5 (04)
:1283-1287