BUILDUP AND ANNEALING OF DAMAGE INDUCED BY ION AND ELECTRON-BEAMS AT SIO2 SURFACES - AN AES STUDY

被引:30
作者
LANG, B
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D O I
10.1016/0169-4332(89)90974-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
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页码:63 / 77
页数:15
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