RAPID-SCAN FOURIER-TRANSFORM SPECTROSCOPY OF 2-D SPACE-CHARGE LAYERS IN SEMICONDUCTORS

被引：45

作者：

BATKE, E

HEITMANN, D

机构：

来源：

INFRARED PHYSICS | 1984年 / 24卷 / 2-3期

关键词：

D O I：

10.1016/0020-0891(84)90069-1

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：189 / 197

页数：9

共 25 条

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