ELECTRONIC DISTRIBUTION OF SIO BY X-RAY SPECTROSCOPY

被引：11

作者：

COSTALIMA, MT ^{[1
]}

SENEMAUD, C ^{[1
]}

机构：

[1] UNIV PARIS 06, CNRS, CHIM PHYS, F-75005 PARIS, FRANCE

来源：

CHEMICAL PHYSICS LETTERS | 1976年 / 40卷 / 01期

关键词：

D O I：

10.1016/0009-2614(76)80141-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：157 / 159

页数：3

共 12 条

[1] CHARACTERIZATION OF SIO USING FINE FEATURES OF X-RAY K EMISSION SPECTRA [J].

BAUN, WL ;

SOLOMON, JS .

VACUUM, 1971, 21 (05) :165-&

[2] A STUDY OF AMORPHOUS SIO [J].

BRADY, GW .

JOURNAL OF PHYSICAL CHEMISTRY, 1959, 63 (07) :1119-1120

[3]

COSTALIMA MT, TO BE PUBLISHED

[4] PHOTOEMISSION MEASUREMENTS OF VALENCE LEVELS OF AMORPHOUS SIO2 [J].

DISTEFANO, TH ;

EASTMAN, DE .

PHYSICAL REVIEW LETTERS, 1971, 27 (23) :1560-+

[5] DEMOUNTABLE HIGH-POWER SOFT X-RAY TUBE AND ITS PERFORMANCE IN 13-27 A REGION [J].

HAGUE, CF .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (02) :119-&

[6]

HOLLINGER G, 1974, INT C TETRAHEDRALLY, P102

[7] X-RAY PHOTOEMISSION SPECTRA OF CRYSTALLINE AND AMORPHOUS SI AND GE VALENCE BANDS [J].

LEY, L ;

SHIRLEY, DA ;

POLLAK, R ;

KOWALCZYK, S .

PHYSICAL REVIEW LETTERS, 1972, 29 (16) :1088-+

[8] STRUCTURE OF SILICON MONOXIDE [J].

LIN, SCH ;

JOSHI, M .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1969, 116 (12) :1740-+

[9] OPTICAL PROPERTIES OF NON-CRYSTALLINE SI, SIO, SIOX AND SIO2 [J].

PHILIPP, HR .

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1971, 32 (08) :1935-&

[10] X-RAY K ABSORPTION-SPECTRA OF SILICON IN SI, SIO AND SIO2 [J].

SENEMAUD, C ;

COSTALIM.MT ;

ROGER, JA ;

CACHARD, A .

CHEMICAL PHYSICS LETTERS, 1974, 26 (03) :431-433

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