MEASUREMENT OF IMPURITIES IN A MULTI-DOPED SAMPLE OF CADMIUM MERCURY TELLURIDE

被引：14

作者：

CLEGG, JB

MULLIN, JB

TIMMINS, KJ

BLACKMORE, GW

EVERETT, GL

SNOOK, R

机构：

[1] ROYAL SIGNALS & RADAR ESTAB,MALVERN WR14 3PS,WORCS,ENGLAND

[2] MAT QUAL ASSURANCE DIRECTORATE,LONDON SE18 6TD,ENGLAND

[3] ADMIRALTY MAT TECHNOL ESTAB,POOLE BH16 6JU,DORSET,ENGLAND

[4] JOHNSON & MATTHEY CHEM LTD,ROYSTON SG8 5HE,HERTS,ENGLAND

[5] UNIV LONDON IMPERIAL COLL SCI & TECHNOL,LONDON SW7 2AY,ENGLAND

来源：

JOURNAL OF ELECTRONIC MATERIALS | 1983年 / 12卷 / 05期

关键词：

D O I：

10.1007/BF02655300

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：879 / 889

页数：11

共 10 条

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[7] DOPING PROPERTIES OF SELECTED IMPURITIES IN HG1-XCDXTE [J].

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[8]

KIRKBRIGHT GF, 1980, ANAL P, V17

[9] IDENTIFICATION AND INVESTIGATION OF IMPURITIES IN UNDOPED HG1-XCDXTE [J].

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[10] PROGRESS IN THE ANALYSIS OF CRYSTALLINE SOLIDS [J].

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