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MEASUREMENT OF IMPURITIES IN A MULTI-DOPED SAMPLE OF CADMIUM MERCURY TELLURIDE
被引:14
作者
:
CLEGG, JB
论文数:
0
引用数:
0
h-index:
0
机构:
ROYAL SIGNALS & RADAR ESTAB,MALVERN WR14 3PS,WORCS,ENGLAND
CLEGG, JB
MULLIN, JB
论文数:
0
引用数:
0
h-index:
0
机构:
ROYAL SIGNALS & RADAR ESTAB,MALVERN WR14 3PS,WORCS,ENGLAND
MULLIN, JB
TIMMINS, KJ
论文数:
0
引用数:
0
h-index:
0
机构:
ROYAL SIGNALS & RADAR ESTAB,MALVERN WR14 3PS,WORCS,ENGLAND
TIMMINS, KJ
BLACKMORE, GW
论文数:
0
引用数:
0
h-index:
0
机构:
ROYAL SIGNALS & RADAR ESTAB,MALVERN WR14 3PS,WORCS,ENGLAND
BLACKMORE, GW
EVERETT, GL
论文数:
0
引用数:
0
h-index:
0
机构:
ROYAL SIGNALS & RADAR ESTAB,MALVERN WR14 3PS,WORCS,ENGLAND
EVERETT, GL
SNOOK, R
论文数:
0
引用数:
0
h-index:
0
机构:
ROYAL SIGNALS & RADAR ESTAB,MALVERN WR14 3PS,WORCS,ENGLAND
SNOOK, R
机构
:
[1]
ROYAL SIGNALS & RADAR ESTAB,MALVERN WR14 3PS,WORCS,ENGLAND
[2]
MAT QUAL ASSURANCE DIRECTORATE,LONDON SE18 6TD,ENGLAND
[3]
ADMIRALTY MAT TECHNOL ESTAB,POOLE BH16 6JU,DORSET,ENGLAND
[4]
JOHNSON & MATTHEY CHEM LTD,ROYSTON SG8 5HE,HERTS,ENGLAND
[5]
UNIV LONDON IMPERIAL COLL SCI & TECHNOL,LONDON SW7 2AY,ENGLAND
来源
:
JOURNAL OF ELECTRONIC MATERIALS
|
1983年
/ 12卷
/ 05期
关键词
:
D O I
:
10.1007/BF02655300
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:879 / 889
页数:11
相关论文
共 10 条
[1]
CONCENTRATIONS OF CARBON AND OXYGEN IN INDIUM-PHOSPHIDE AND GALLIUM-ARSENIDE CRYSTALS GROWN BY LEC TECHNIQUE
[J].
BLACKMORE, GW
论文数:
0
引用数:
0
h-index:
0
机构:
ADMIRALTY MAT LAB, POOLE, DORSETSHIRE, ENGLAND
BLACKMORE, GW
;
CLEGG, JB
论文数:
0
引用数:
0
h-index:
0
机构:
ADMIRALTY MAT LAB, POOLE, DORSETSHIRE, ENGLAND
CLEGG, JB
;
HISLOP, JS
论文数:
0
引用数:
0
h-index:
0
机构:
ADMIRALTY MAT LAB, POOLE, DORSETSHIRE, ENGLAND
HISLOP, JS
;
MULLIN, JB
论文数:
0
引用数:
0
h-index:
0
机构:
ADMIRALTY MAT LAB, POOLE, DORSETSHIRE, ENGLAND
MULLIN, JB
.
JOURNAL OF ELECTRONIC MATERIALS,
1976,
5
(04)
:401
-413
[2]
CARBON, OXYGEN AND SILICON IMPURITIES IN GALLIUM-ARSENIDE
[J].
BROZEL, MR
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
BROZEL, MR
;
CLEGG, JB
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
CLEGG, JB
;
NEWMAN, RC
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
NEWMAN, RC
.
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1978,
11
(09)
:1331
-1339
[3]
IMPROVED SYSTEM FOR THE BRIDGMAN GROWTH OF CRYSTALS WITH TOXIC AND-OR HIGHLY VOLATILE COMPONENTS
[J].
CAPPER, P
论文数:
0
引用数:
0
h-index:
0
机构:
BIRLEC LTD,ALDRIDGE,ENGLAND
BIRLEC LTD,ALDRIDGE,ENGLAND
CAPPER, P
;
HARRIS, JE
论文数:
0
引用数:
0
h-index:
0
机构:
BIRLEC LTD,ALDRIDGE,ENGLAND
BIRLEC LTD,ALDRIDGE,ENGLAND
HARRIS, JE
;
NICHOLSON, D
论文数:
0
引用数:
0
h-index:
0
机构:
BIRLEC LTD,ALDRIDGE,ENGLAND
BIRLEC LTD,ALDRIDGE,ENGLAND
NICHOLSON, D
;
COLE, D
论文数:
0
引用数:
0
h-index:
0
机构:
BIRLEC LTD,ALDRIDGE,ENGLAND
BIRLEC LTD,ALDRIDGE,ENGLAND
COLE, D
.
JOURNAL OF CRYSTAL GROWTH,
1979,
46
(04)
:575
-581
[4]
QUANTITATIVE MEASUREMENT OF IMPURITIES IN GALLIUM-ARSENIDE
[J].
CLEGG, JB
论文数:
0
引用数:
0
h-index:
0
CLEGG, JB
;
GRAINGER, F
论文数:
0
引用数:
0
h-index:
0
GRAINGER, F
;
GALE, IG
论文数:
0
引用数:
0
h-index:
0
GALE, IG
.
JOURNAL OF MATERIALS SCIENCE,
1980,
15
(03)
:747
-750
[5]
COWEY K, 1978, MQAD819 TECHN PAP
[6]
DIRECT ANALYSIS OF SOLID CADMIUM MERCURY TELLURIDE BY FLAMELESS ATOMIC-ABSORPTION USING INTERACTIVE COMPUTER-PROCESSING
[J].
GRAINGER, F
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, Redhill, Surrey
GRAINGER, F
;
GALE, IG
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, Redhill, Surrey
GALE, IG
.
JOURNAL OF MATERIALS SCIENCE,
1979,
14
(06)
:1370
-1374
[7]
DOPING PROPERTIES OF SELECTED IMPURITIES IN HG1-XCDXTE
[J].
JOHNSON, ES
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC,RECH CTR,BLOOMINGTON,MN 55420
JOHNSON, ES
;
SCHMIT, JL
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC,RECH CTR,BLOOMINGTON,MN 55420
SCHMIT, JL
.
JOURNAL OF ELECTRONIC MATERIALS,
1977,
6
(01)
:25
-38
[8]
KIRKBRIGHT GF, 1980, ANAL P, V17
[9]
IDENTIFICATION AND INVESTIGATION OF IMPURITIES IN UNDOPED HG1-XCDXTE
[J].
LIN, JW
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC,CORP RES CTR,10701 LYNDALE AVE S,BLOOMINGTON,MN 55420
HONEYWELL INC,CORP RES CTR,10701 LYNDALE AVE S,BLOOMINGTON,MN 55420
LIN, JW
.
JOURNAL OF SOLID STATE CHEMISTRY,
1975,
15
(01)
:96
-101
[10]
PROGRESS IN THE ANALYSIS OF CRYSTALLINE SOLIDS
[J].
MILLETT, EJ
论文数:
0
引用数:
0
h-index:
0
MILLETT, EJ
.
JOURNAL OF CRYSTAL GROWTH,
1980,
48
(04)
:666
-682
←
1
→
共 10 条
[1]
CONCENTRATIONS OF CARBON AND OXYGEN IN INDIUM-PHOSPHIDE AND GALLIUM-ARSENIDE CRYSTALS GROWN BY LEC TECHNIQUE
[J].
BLACKMORE, GW
论文数:
0
引用数:
0
h-index:
0
机构:
ADMIRALTY MAT LAB, POOLE, DORSETSHIRE, ENGLAND
BLACKMORE, GW
;
CLEGG, JB
论文数:
0
引用数:
0
h-index:
0
机构:
ADMIRALTY MAT LAB, POOLE, DORSETSHIRE, ENGLAND
CLEGG, JB
;
HISLOP, JS
论文数:
0
引用数:
0
h-index:
0
机构:
ADMIRALTY MAT LAB, POOLE, DORSETSHIRE, ENGLAND
HISLOP, JS
;
MULLIN, JB
论文数:
0
引用数:
0
h-index:
0
机构:
ADMIRALTY MAT LAB, POOLE, DORSETSHIRE, ENGLAND
MULLIN, JB
.
JOURNAL OF ELECTRONIC MATERIALS,
1976,
5
(04)
:401
-413
[2]
CARBON, OXYGEN AND SILICON IMPURITIES IN GALLIUM-ARSENIDE
[J].
BROZEL, MR
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
BROZEL, MR
;
CLEGG, JB
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
CLEGG, JB
;
NEWMAN, RC
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
NEWMAN, RC
.
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1978,
11
(09)
:1331
-1339
[3]
IMPROVED SYSTEM FOR THE BRIDGMAN GROWTH OF CRYSTALS WITH TOXIC AND-OR HIGHLY VOLATILE COMPONENTS
[J].
CAPPER, P
论文数:
0
引用数:
0
h-index:
0
机构:
BIRLEC LTD,ALDRIDGE,ENGLAND
BIRLEC LTD,ALDRIDGE,ENGLAND
CAPPER, P
;
HARRIS, JE
论文数:
0
引用数:
0
h-index:
0
机构:
BIRLEC LTD,ALDRIDGE,ENGLAND
BIRLEC LTD,ALDRIDGE,ENGLAND
HARRIS, JE
;
NICHOLSON, D
论文数:
0
引用数:
0
h-index:
0
机构:
BIRLEC LTD,ALDRIDGE,ENGLAND
BIRLEC LTD,ALDRIDGE,ENGLAND
NICHOLSON, D
;
COLE, D
论文数:
0
引用数:
0
h-index:
0
机构:
BIRLEC LTD,ALDRIDGE,ENGLAND
BIRLEC LTD,ALDRIDGE,ENGLAND
COLE, D
.
JOURNAL OF CRYSTAL GROWTH,
1979,
46
(04)
:575
-581
[4]
QUANTITATIVE MEASUREMENT OF IMPURITIES IN GALLIUM-ARSENIDE
[J].
CLEGG, JB
论文数:
0
引用数:
0
h-index:
0
CLEGG, JB
;
GRAINGER, F
论文数:
0
引用数:
0
h-index:
0
GRAINGER, F
;
GALE, IG
论文数:
0
引用数:
0
h-index:
0
GALE, IG
.
JOURNAL OF MATERIALS SCIENCE,
1980,
15
(03)
:747
-750
[5]
COWEY K, 1978, MQAD819 TECHN PAP
[6]
DIRECT ANALYSIS OF SOLID CADMIUM MERCURY TELLURIDE BY FLAMELESS ATOMIC-ABSORPTION USING INTERACTIVE COMPUTER-PROCESSING
[J].
GRAINGER, F
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, Redhill, Surrey
GRAINGER, F
;
GALE, IG
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, Redhill, Surrey
GALE, IG
.
JOURNAL OF MATERIALS SCIENCE,
1979,
14
(06)
:1370
-1374
[7]
DOPING PROPERTIES OF SELECTED IMPURITIES IN HG1-XCDXTE
[J].
JOHNSON, ES
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC,RECH CTR,BLOOMINGTON,MN 55420
JOHNSON, ES
;
SCHMIT, JL
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC,RECH CTR,BLOOMINGTON,MN 55420
SCHMIT, JL
.
JOURNAL OF ELECTRONIC MATERIALS,
1977,
6
(01)
:25
-38
[8]
KIRKBRIGHT GF, 1980, ANAL P, V17
[9]
IDENTIFICATION AND INVESTIGATION OF IMPURITIES IN UNDOPED HG1-XCDXTE
[J].
LIN, JW
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC,CORP RES CTR,10701 LYNDALE AVE S,BLOOMINGTON,MN 55420
HONEYWELL INC,CORP RES CTR,10701 LYNDALE AVE S,BLOOMINGTON,MN 55420
LIN, JW
.
JOURNAL OF SOLID STATE CHEMISTRY,
1975,
15
(01)
:96
-101
[10]
PROGRESS IN THE ANALYSIS OF CRYSTALLINE SOLIDS
[J].
MILLETT, EJ
论文数:
0
引用数:
0
h-index:
0
MILLETT, EJ
.
JOURNAL OF CRYSTAL GROWTH,
1980,
48
(04)
:666
-682
←
1
→