SURFACE RELATED CORE LEVEL SHIFTS FOR THE SI(111)SQUARE-ROOT-3X SQUARE-ROOT-3 - AL SYSTEM

被引:6
作者
ANDERSEN, JN
WIGREN, C
KARLSSON, UO
机构
[1] MAX-LAB, Lund University, Box 118, Lund
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1991年 / 9卷 / 04期
关键词
D O I
10.1116/1.585707
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The Si(111) square-root 3 x square-root 3:Al reconstruction has been studied by surface sensitive high resolution core level spectroscopy. It is shown that three components are needed to fit the Si 2p spectra. The Al2p emission is found to consist of more than one component and it is argued that this is related to defects in the overlayer.
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页码:2384 / 2387
页数:4
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