TIP-RELATED ELECTRONIC ARTIFACTS IN SCANNING TUNNELING SPECTROSCOPY

被引：31

作者：

PELZ, JP ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,DIV RES,YORKTOWN HTS,NY 10598

来源：

PHYSICAL REVIEW B | 1991年 / 43卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.43.6746

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The electronic spectrum of the probe tip is found to play a crucial role in measurements of scanning tunneling spectroscopy. Tips with a nonuniform density of states can produce highly convoluted I-V curves, even if they produce atomic-resolution topographic images. In some cases, tips with a strongly peaked density of states away from the Fermi level can shift the apparent energy of spectral features of the sample by as much as 1 eV.

引用

页码：6746 / 6749

页数：4

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