UHV CVD GROWTH OF SI AND SI-GE ALLOYS - CHEMISTRY, PHYSICS, AND DEVICE APPLICATIONS

被引:128
作者
MEYERSON, BS [1 ]
机构
[1] IBM CORP,DIV RES,TJ WATSON RES CTR,YORKTOWN HTS,NY 10598
关键词
D O I
10.1109/5.168668
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Over the period of the past five years, major advances in techniques for the low-temperature preparation of epitaxial films in the silicon/germanium materials system have led to remarkable progress in silicon-based device technology. The fundamental chemical principles underlying one of these growth methods, ultrahigh vacuum/chemical vapor deposition (UHV/CVD), are described in this overview. A variety of unique devices and structures, for example high-speed graded bandgap heterojunction bipolar transistors and n-type resonant tunneling diodes, will be discussed. The role of fundamental interface chemistry in making such structures possible will also be considered.
引用
收藏
页码:1592 / 1608
页数:17
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