SPECTROSCOPIC CHARACTERIZATION OF MATERIAL AND JUNCTION IN AMORPHOUS-SILICON SOLAR-CELLS

被引：6

作者：

OKAMOTO, H

KIDA, H

HAMAKAWA, Y

机构：

[1] Osaka Univ, Toyonaka, Jpn, Osaka Univ, Toyonaka, Jpn

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1985年 / 77-8卷

关键词：

SEMICONDUCTING SILICON - Amorphous - SEMICONDUCTOR DEVICES - Junctions - SPECTROSCOPY - Applications;

D O I：

10.1016/0022-3093(85)90927-5

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Useful information about material and junction properties are obtained from the field-modulated reflectance and primary photocurrent measurements, all of which can be readily applied to actual solar cell structures. The paper introduces these spectroscopic techniques and presents some results as well as a brief discussion on them in conjunction with device performance.

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收藏

页码：1441 / 1449

页数：9

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