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LOW-PRESSURE DEPOSITION OF PHOSPHOSILICATE GLASS-FILMS
被引:42
作者
:
LEVIN, RM
论文数:
0
引用数:
0
h-index:
0
LEVIN, RM
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
ADAMS, AC
机构
:
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1982年
/ 129卷
/ 07期
关键词
:
D O I
:
10.1149/1.2124213
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:1588 / 1592
页数:5
相关论文
共 20 条
[1]
EVALUATION OF THE PRISM COUPLER FOR MEASURING THE THICKNESS AND REFRACTIVE-INDEX OF DIELECTRIC FILMS ON SILICON SUBSTRATES
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
ADAMS, AC
SCHINKE, DP
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
SCHINKE, DP
CAPIO, CD
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
CAPIO, CD
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(09)
: 1539
-
1543
[2]
DEPOSITION OF SILICON DIOXIDE FILMS AT REDUCED PRESSURE
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
ADAMS, AC
CAPIO, CD
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
CAPIO, CD
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(06)
: 1042
-
1046
[3]
MEASURING THE PHOSPHORUS CONCENTRATION IN DEPOSITED PHOSPHOSILICATE FILMS
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
ADAMS, AC
MURARKA, SP
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
MURARKA, SP
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(02)
: 334
-
338
[4]
HIGH-TEMPERATURE DEPOSITION AND EVALUATION OF PHOSPHORUS-DOPED OR BORON-DOPED SILICON DIOXIDE FILMS
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
ADAMS, AC
CAPIO, CD
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
CAPIO, CD
HASZKO, SE
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
HASZKO, SE
PARISI, GI
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
PARISI, GI
POVILONIS, EI
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
POVILONIS, EI
ROBINSON, M
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
ROBINSON, M
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(02)
: 313
-
319
[5]
DETERMINATION OF PROPERTIES OF FILMS ON SILICON BY METHOD OF ELLIPSOMETRY
ARCHER, RJ
论文数:
0
引用数:
0
h-index:
0
ARCHER, RJ
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1962,
52
(09)
: 970
-
&
[6]
SCANNING ELECTRON-MICROSCOPE INVESTIGATION OF GLASS FLOW IN MOS INTEGRATED-CIRCUIT FABRICATION
ARMSTRONG, WE
论文数:
0
引用数:
0
h-index:
0
机构:
MOTOROLA INC, SEMICOND PROD DIV, PHOENIX, AZ 85008 USA
MOTOROLA INC, SEMICOND PROD DIV, PHOENIX, AZ 85008 USA
ARMSTRONG, WE
TOLLIVER, DL
论文数:
0
引用数:
0
h-index:
0
机构:
MOTOROLA INC, SEMICOND PROD DIV, PHOENIX, AZ 85008 USA
MOTOROLA INC, SEMICOND PROD DIV, PHOENIX, AZ 85008 USA
TOLLIVER, DL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1974,
121
(02)
: 307
-
310
[7]
GROWTH OF SILICA AND PHOSPHOSILICATE FILMS
BALIGA, BJ
论文数:
0
引用数:
0
h-index:
0
机构:
RENSSELAER POLYTECH INST,ELECTROPHYS & ELECTR ENGN DIV,TROY,NY 12181
RENSSELAER POLYTECH INST,ELECTROPHYS & ELECTR ENGN DIV,TROY,NY 12181
BALIGA, BJ
GHANDHI, SK
论文数:
0
引用数:
0
h-index:
0
机构:
RENSSELAER POLYTECH INST,ELECTROPHYS & ELECTR ENGN DIV,TROY,NY 12181
RENSSELAER POLYTECH INST,ELECTROPHYS & ELECTR ENGN DIV,TROY,NY 12181
GHANDHI, SK
[J].
JOURNAL OF APPLIED PHYSICS,
1973,
44
(03)
: 990
-
994
[8]
KERN W, 1976, RCA REV, V37, P3
[9]
KERN W, 1973, RCA REV, V34, P655
[10]
KERN W, 1976, SOLID STATE TECHNOL, V18, P25
←
1
2
→
共 20 条
[1]
EVALUATION OF THE PRISM COUPLER FOR MEASURING THE THICKNESS AND REFRACTIVE-INDEX OF DIELECTRIC FILMS ON SILICON SUBSTRATES
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
ADAMS, AC
SCHINKE, DP
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
SCHINKE, DP
CAPIO, CD
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
CAPIO, CD
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(09)
: 1539
-
1543
[2]
DEPOSITION OF SILICON DIOXIDE FILMS AT REDUCED PRESSURE
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
ADAMS, AC
CAPIO, CD
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
CAPIO, CD
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(06)
: 1042
-
1046
[3]
MEASURING THE PHOSPHORUS CONCENTRATION IN DEPOSITED PHOSPHOSILICATE FILMS
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
ADAMS, AC
MURARKA, SP
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
MURARKA, SP
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(02)
: 334
-
338
[4]
HIGH-TEMPERATURE DEPOSITION AND EVALUATION OF PHOSPHORUS-DOPED OR BORON-DOPED SILICON DIOXIDE FILMS
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
ADAMS, AC
CAPIO, CD
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
CAPIO, CD
HASZKO, SE
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
HASZKO, SE
PARISI, GI
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
PARISI, GI
POVILONIS, EI
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
POVILONIS, EI
ROBINSON, M
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
ROBINSON, M
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(02)
: 313
-
319
[5]
DETERMINATION OF PROPERTIES OF FILMS ON SILICON BY METHOD OF ELLIPSOMETRY
ARCHER, RJ
论文数:
0
引用数:
0
h-index:
0
ARCHER, RJ
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1962,
52
(09)
: 970
-
&
[6]
SCANNING ELECTRON-MICROSCOPE INVESTIGATION OF GLASS FLOW IN MOS INTEGRATED-CIRCUIT FABRICATION
ARMSTRONG, WE
论文数:
0
引用数:
0
h-index:
0
机构:
MOTOROLA INC, SEMICOND PROD DIV, PHOENIX, AZ 85008 USA
MOTOROLA INC, SEMICOND PROD DIV, PHOENIX, AZ 85008 USA
ARMSTRONG, WE
TOLLIVER, DL
论文数:
0
引用数:
0
h-index:
0
机构:
MOTOROLA INC, SEMICOND PROD DIV, PHOENIX, AZ 85008 USA
MOTOROLA INC, SEMICOND PROD DIV, PHOENIX, AZ 85008 USA
TOLLIVER, DL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1974,
121
(02)
: 307
-
310
[7]
GROWTH OF SILICA AND PHOSPHOSILICATE FILMS
BALIGA, BJ
论文数:
0
引用数:
0
h-index:
0
机构:
RENSSELAER POLYTECH INST,ELECTROPHYS & ELECTR ENGN DIV,TROY,NY 12181
RENSSELAER POLYTECH INST,ELECTROPHYS & ELECTR ENGN DIV,TROY,NY 12181
BALIGA, BJ
GHANDHI, SK
论文数:
0
引用数:
0
h-index:
0
机构:
RENSSELAER POLYTECH INST,ELECTROPHYS & ELECTR ENGN DIV,TROY,NY 12181
RENSSELAER POLYTECH INST,ELECTROPHYS & ELECTR ENGN DIV,TROY,NY 12181
GHANDHI, SK
[J].
JOURNAL OF APPLIED PHYSICS,
1973,
44
(03)
: 990
-
994
[8]
KERN W, 1976, RCA REV, V37, P3
[9]
KERN W, 1973, RCA REV, V34, P655
[10]
KERN W, 1976, SOLID STATE TECHNOL, V18, P25
←
1
2
→