RAMAN STUDIES OF THE P-LOCAL MODE VIBRATION IN P-IMPLANTED, LASER ANNEALED GE

被引:10
作者
CONTRERAS, G [1 ]
COMPAAN, A [1 ]
AXMANN, A [1 ]
机构
[1] FRAUNHOFER INST ANGEW FESTKORPERPHYS,D-7800 FREIBURG,FED REP GER
来源
JOURNAL DE PHYSIQUE | 1983年 / 44卷 / NC-5期
关键词
D O I
10.1051/jphyscol:1983530
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学科分类号
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页码:193 / 195
页数:3
相关论文
共 9 条
[1]   EFFECT OF CARRIER CONCENTRATION ON RAMAN FREQUENCIES OF SI AND GE [J].
CERDEIRA, F ;
CARDONA, M .
PHYSICAL REVIEW B, 1972, 5 (04) :1440-&
[2]   STUDY OF THE LOCALIZED VIBRATIONS OF BORON IN HEAVILY DOPED SI [J].
CHANDRASEKHAR, M ;
CHANDRASEKHAR, HR ;
GRIMSDITCH, M ;
CARDONA, M .
PHYSICAL REVIEW B, 1980, 22 (10) :4825-4833
[3]   PHONON SOFTENING IN ULTRA HEAVILY DOPED SI AND GE [J].
COMPAAN, A ;
CONTRERAS, G ;
CARDONA, M ;
AXMANN, A .
JOURNAL DE PHYSIQUE, 1983, 44 (NC-5) :197-201
[4]  
COS AE, 1967, APPLIED PHYS LETT, V11, P279
[5]  
MADELUNG O, 1982, LANDOLDTBORNSTEIN A, V17
[6]   SECOND-ORDER RAMAN-SCATTERING IN GERMANIUM IN VICINITY OF E1, E1 + DELTA1 EDGES [J].
RENUCCI, MA ;
RENUCCI, JB ;
ZEYHER, R ;
CARDONA, M .
PHYSICAL REVIEW B, 1974, 10 (10) :4309-4323
[7]  
RENUCCI MA, 1972, LIGHT SCATTERING SOL, P276
[8]   THE ELECTRONIC-STRUCTURE OF HEAVILY DOPED ION-IMPLANTED LASER ANNEALED SILICON - ELLIPSOMETRIC MEASUREMENTS [J].
VINA, L ;
UMBACH, C ;
COMPAAN, A ;
CARDONA, M ;
AXMANN, A .
JOURNAL DE PHYSIQUE, 1983, 44 (NC-5) :203-208
[9]   PHOTOLUMINESCENCE IN HEAVILY DOPED SI AND GE [J].
WAGNER, J ;
COMPAAN, A ;
AXMANN, A .
JOURNAL DE PHYSIQUE, 1983, 44 (NC-5) :61-64