EVALUATION OF INTERFACE PARAMETERS IN MIS STRUCTURES .1. THEORY

被引：2

作者：

DEGRYSE, R ^{[1
]}

VLAMINCK, R ^{[1
]}

VENNIK, J ^{[1
]}

机构：

[1] RIJKS UNIV GHENT,LAB KRISTALLOG STUDIE VASTE STOF,KRIJGSLAAN 271,B-9000 GHENT,BELGIUM

来源：

SOLID-STATE ELECTRONICS | 1975年 / 18卷 / 02期

关键词：

D O I：

10.1016/0038-1101(75)90098-2

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：151 / 159

页数：9

相关论文

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