PREPARATION OF METALLIC W-FILM BY H2-REDUCTION OF WO3 ELECTRON-RESIST FILM

被引:6
作者
BABA, M
OHTA, K
IKEDA, T
机构
[1] Department of Electronic Engineering, Iwate University, Morioka, 020
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1991年 / 30卷 / 10期
关键词
WO3; FILM; ELECTRON-RESIST FILM; H2-REDUCTION; W-FILM; FILM CHARACTERIZATION; W-FILM PATTERN;
D O I
10.1143/JJAP.30.2581
中图分类号
O59 [应用物理学];
学科分类号
摘要
A metallic W film was prepared from a WO3 electron-resist film by H-2-reduction above 600-degrees-C, and the characteristics of the reduced W film have been investigated. It was found that the electric resistivity of the film decreases and the size of the constituent grains increases with increasing reduction temperature, while the film thickness decreases down to about 40% of the initial thickness above 600-degrees-C. The reduced W film had a discontinuous structure with many cracks and had random crystal orientation of the grains. A fine pattern of metallic W with high contrast and no crack was fabricated by the H-2-reduction of a fine pattern of the WO3 electron resist.
引用
收藏
页码:2581 / 2584
页数:4
相关论文
共 8 条
  • [1] ANDERSON JR, 1971, CHEMISORPTION REACTI, P8
  • [2] SELECTIVE MASKING EFFECTS OF WO3 RESIST ON IMPURITY DIFFUSION AND OXIDATION IN SILICON
    BABA, M
    ABE, S
    IKEDA, T
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1987, 26 (09): : 1561 - 1564
  • [3] A NEW INORGANIC ELECTRON RESIST USING AMORPHOUS WO-3 FILM
    BABA, M
    IKEDA, T
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (02) : L149 - L152
  • [4] STRESS-INDUCED GRAIN-BOUNDARY FRACTURES IN AL-SI INTERCONNECTS
    HINODE, K
    OWADA, N
    NISHIDA, T
    MUKAI, K
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (02): : 518 - 522
  • [5] A NEW TUNGSTEN GATE PROCESS FOR VLSI APPLICATIONS
    IWATA, S
    YAMAMOTO, N
    KOBAYASHI, N
    TERADA, T
    MIZUTANI, T
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (09) : 1174 - 1179
  • [6] MOO3 ELECTRON RESIST AND ITS APPLICATION TO FABRICATION OF MO FINE PATTERN
    KUMADA, F
    OKAMOTO, M
    BABA, M
    IKEDA, T
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1986, 25 (07): : L574 - L576
  • [7] NELSON G, 1984, 22ND P REL PHYS S NE, P6
  • [8] EFFECT OF HEAT-TREATMENT AFTER DEPOSITION ON INTERNAL-STRESS IN MOLYBDENUM FILMS ON SIO2-SI SUBSTRATES
    OIKAWA, H
    NAKAJIMA, Y
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1977, 14 (05): : 1153 - 1156