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HIGH-PERFORMANCE SOI-CMOS TRANSISTORS IN OXYGEN-IMPLANTED SILICON WITHOUT EPITAXY
被引:15
作者
:
DAVIS, JR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECT & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
DAVIS, JR
REESON, KJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECT & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
REESON, KJ
HEMMENT, PLF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECT & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
HEMMENT, PLF
MARSH, CD
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECT & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
MARSH, CD
机构
:
[1]
UNIV SURREY,DEPT ELECT & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
[2]
UNIV OXFORD,DEPT MET & SCI MAT,OXFORD,ENGLAND
来源
:
IEEE ELECTRON DEVICE LETTERS
|
1987年
/ 8卷
/ 07期
关键词
:
D O I
:
10.1109/EDL.1987.26635
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:291 / 293
页数:3
相关论文
共 10 条
[1]
ARMSTRONG GA, 1986, 2ND P INT C PROC DEV, P446
[2]
CHATER R, UNPUB
[3]
REDUCTION OF FLOATING SUBSTRATE EFFECT IN THIN-FILM SOI MOSFETS
COLINGE, JP
论文数:
0
引用数:
0
h-index:
0
机构:
Hewlett Packard Lab, Palo Alto, CA,, USA, Hewlett Packard Lab, Palo Alto, CA, USA
COLINGE, JP
[J].
ELECTRONICS LETTERS,
1986,
22
(04)
: 187
-
188
[4]
PROFILING OF INHOMOGENEOUS CARRIER TRANSPORT-PROPERTIES WITH THE INFLUENCE OF TEMPERATURE IN SILICON-ON-INSULATOR FILMS FORMED BY OXYGEN IMPLANTATION
CRISTOLOVEANU, S
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
CRISTOLOVEANU, S
LEE, JH
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
LEE, JH
PUMFREY, J
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
PUMFREY, J
DAVIS, JR
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
DAVIS, JR
ARROWSMITH, RP
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
ARROWSMITH, RP
HEMMENT, PLF
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
HEMMENT, PLF
[J].
JOURNAL OF APPLIED PHYSICS,
1986,
60
(09)
: 3199
-
3203
[5]
SUBTHRESHOLD CURRENTS IN CMOS TRANSISTORS MADE ON OXYGEN-IMPLANTED SILICON
FOSTER, DJ
论文数:
0
引用数:
0
h-index:
0
FOSTER, DJ
[J].
ELECTRONICS LETTERS,
1983,
19
(17)
: 684
-
685
[6]
PROMOTION OF PRACTICAL SIMOX TECHNOLOGY BY THE DEVELOPMENT OF A 100 MA-CLASS HIGH-CURRENT OXYGEN IMPLANTER
IZUMI, K
论文数:
0
引用数:
0
h-index:
0
IZUMI, K
OMURA, Y
论文数:
0
引用数:
0
h-index:
0
OMURA, Y
NAKASHIMA, S
论文数:
0
引用数:
0
h-index:
0
NAKASHIMA, S
[J].
ELECTRONICS LETTERS,
1986,
22
(15)
: 775
-
777
[7]
MARGAIL J, 1985, MAY MAT RES SOC M ST
[8]
MOFFATT S, 1987, IN PRESS NUCL INSTRU
[9]
EFFECTS OF IMPLANTATION TEMPERATURE ON THE PROPERTIES OF BURIED OXIDE LAYERS IN SILICON FORMED BY OXYGEN ION-IMPLANTATION
TUPPEN, CG
论文数:
0
引用数:
0
h-index:
0
TUPPEN, CG
TAYLOR, MR
论文数:
0
引用数:
0
h-index:
0
TAYLOR, MR
HEMMENT, PLF
论文数:
0
引用数:
0
h-index:
0
HEMMENT, PLF
ARROWSMITH, RP
论文数:
0
引用数:
0
h-index:
0
ARROWSMITH, RP
[J].
APPLIED PHYSICS LETTERS,
1984,
45
(01)
: 57
-
59
[10]
YALLUP NE, 1986, APPL PHYS LETT, V48, P70
←
1
→
共 10 条
[1]
ARMSTRONG GA, 1986, 2ND P INT C PROC DEV, P446
[2]
CHATER R, UNPUB
[3]
REDUCTION OF FLOATING SUBSTRATE EFFECT IN THIN-FILM SOI MOSFETS
COLINGE, JP
论文数:
0
引用数:
0
h-index:
0
机构:
Hewlett Packard Lab, Palo Alto, CA,, USA, Hewlett Packard Lab, Palo Alto, CA, USA
COLINGE, JP
[J].
ELECTRONICS LETTERS,
1986,
22
(04)
: 187
-
188
[4]
PROFILING OF INHOMOGENEOUS CARRIER TRANSPORT-PROPERTIES WITH THE INFLUENCE OF TEMPERATURE IN SILICON-ON-INSULATOR FILMS FORMED BY OXYGEN IMPLANTATION
CRISTOLOVEANU, S
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
CRISTOLOVEANU, S
LEE, JH
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
LEE, JH
PUMFREY, J
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
PUMFREY, J
DAVIS, JR
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
DAVIS, JR
ARROWSMITH, RP
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
ARROWSMITH, RP
HEMMENT, PLF
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
HEMMENT, PLF
[J].
JOURNAL OF APPLIED PHYSICS,
1986,
60
(09)
: 3199
-
3203
[5]
SUBTHRESHOLD CURRENTS IN CMOS TRANSISTORS MADE ON OXYGEN-IMPLANTED SILICON
FOSTER, DJ
论文数:
0
引用数:
0
h-index:
0
FOSTER, DJ
[J].
ELECTRONICS LETTERS,
1983,
19
(17)
: 684
-
685
[6]
PROMOTION OF PRACTICAL SIMOX TECHNOLOGY BY THE DEVELOPMENT OF A 100 MA-CLASS HIGH-CURRENT OXYGEN IMPLANTER
IZUMI, K
论文数:
0
引用数:
0
h-index:
0
IZUMI, K
OMURA, Y
论文数:
0
引用数:
0
h-index:
0
OMURA, Y
NAKASHIMA, S
论文数:
0
引用数:
0
h-index:
0
NAKASHIMA, S
[J].
ELECTRONICS LETTERS,
1986,
22
(15)
: 775
-
777
[7]
MARGAIL J, 1985, MAY MAT RES SOC M ST
[8]
MOFFATT S, 1987, IN PRESS NUCL INSTRU
[9]
EFFECTS OF IMPLANTATION TEMPERATURE ON THE PROPERTIES OF BURIED OXIDE LAYERS IN SILICON FORMED BY OXYGEN ION-IMPLANTATION
TUPPEN, CG
论文数:
0
引用数:
0
h-index:
0
TUPPEN, CG
TAYLOR, MR
论文数:
0
引用数:
0
h-index:
0
TAYLOR, MR
HEMMENT, PLF
论文数:
0
引用数:
0
h-index:
0
HEMMENT, PLF
ARROWSMITH, RP
论文数:
0
引用数:
0
h-index:
0
ARROWSMITH, RP
[J].
APPLIED PHYSICS LETTERS,
1984,
45
(01)
: 57
-
59
[10]
YALLUP NE, 1986, APPL PHYS LETT, V48, P70
←
1
→