ANISOTROPIC STRESS-SENSITIVE TEMPERATURE-DEPENDENCE OF THE LATTICE-CONSTANT OF SILICON

被引：6

作者：

SOEJIMA, Y ^{[1
]}

INOUE, K ^{[1
]}

KAWAHARA, T ^{[1
]}

OHAMA, N ^{[1
]}

OKAZAKI, A ^{[1
]}

机构：

[1] KYUSHU UNIV 33,DEPT PHYS,FUKUOKA 812,JAPAN

来源：

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS | 1985年 / 18卷 / 12期

关键词：

D O I：

10.1088/0022-3719/18/12/007

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：2431 / 2436

页数：6

共 9 条

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[6] IMPROVEMENT OF HIGH-ANGLE DOUBLE-CRYSTAL X-RAY-DIFFRACTOMETRY (HADOX) FOR MEASURING TEMPERATURE-DEPENDENCE OF LATTICE-CONSTANTS .1. THEORY [J].

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[7] MEASUREMENT OF THE LATTICE-CONSTANT OF KMNF3 AROUND THE 186-K PHASE-TRANSITION - DETERMINATION OF THE CRITICAL EXPONENT [J].

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[8]

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[9] ANOMALOUS TEMPERATURE-DEPENDENCE OF LATTICE-CONSTANT IN SILICON-CRYSTALS [J].

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