ELECTRON-SPIN RESONANCE MEASUREMENTS AND ELECTRICAL CHARACTERISTICS, BEFORE AND AFTER ELECTROFORMING, OF THIN-FILMS OF SIO/NB2O5 AND NB2O5

被引：7

作者：

ALISMAIL, SAY

ARSHAK, K

HOGARTH, CA

机构：

[1] Brunel Univ, Dep of Physics,, Uxbridge, Engl, Brunel Univ, Dep of Physics, Uxbridge, Engl

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1985年 / 89卷 / 01期

关键词：

D O I：

10.1002/pssa.2210890138

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

SEMICONDUCTING FILMS

引用

页码：363 / 374

页数：12

共 48 条

[1] A STUDY OF THE ELECTRICAL CHARACTERISTICS, BEFORE ELECTROFORMING, OF THIN SIOX FILMS WITH LATERALLY-SPACED ELECTRODES [J].

ALISMAIL, SAY ;

HOGARTH, CA .

JOURNAL OF MATERIALS SCIENCE, 1983, 18 (09) :2777-2784

[2] TEMPERATURE-DEPENDENCE OF VOLTAGE-CONTROLLED NEGATIVE-RESISTANCE IN AN ELECTROFORMED CU-SIOX-CU STRUCTURE [J].

ALISMAIL, SAY ;

HOGARTH, CA .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 76 (02) :559-563

[3] CORRELATION BETWEEN ELECTRON-SPIN RESONANCE, ELECTRICAL-CONDUCTIVITY AND OPTICAL-ABSORPTION EDGE OF CO-EVAPORATED THIN-FILMS OF THE DIELECTRIC SYSTEM SIO/V2O5 [J].

ALRAMADHAN, FAS ;

ARSHAK, KI ;

HOGARTH, CA .

JOURNAL OF MATERIALS SCIENCE, 1984, 19 (11) :3687-3691

[4]

Argall F, 1966, ELECTRON LETT, V2, P282, DOI 10.1049/el:19660238

[5] A STUDY OF ELECTRON-SPIN RESONANCE AND OPTICAL-ABSORPTION EDGE IN AMORPHOUS MIXED FILMS OF SIO AND IN2O3 [J].

ARSHAK, K ;

HOGARTH, CA ;

ILYAS, M .

JOURNAL OF MATERIALS SCIENCE LETTERS, 1984, 3 (12) :1035-1038

[6] ELECTRON-SPIN RESONANCE AND SOME ELECTRICAL AND OPTICAL-PROPERTIES OF GEO2/SIOX THIN-FILMS [J].

ARSHAK, KI ;

ALRAMADHAN, FAS ;

HOGARTH, CA .

JOURNAL OF MATERIALS SCIENCE, 1984, 19 (05) :1505-1509

[7]

ARSHAK KI, UNPUB THIN SOLID FIL

[8] ELECTRICAL PROPERTIES OF AL-AL203-METAL STRUCTURES [J].

BARRIAC, C ;

PINARD, P ;

DAVOINE, F .

PHYSICA STATUS SOLIDI, 1969, 34 (02) :621-&

[9] BISTABLE SWITCHING AND CONDUCTION MECHANISMS IN NB-NB2O5-BI JUNCTIONS [J].

BASAVAIA.S ;

PARK, KC .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1973, ED20 (02) :149-157

[10] STRUCTURAL, OPTICAL, AND ELECTRICAL PROPERTIES OF AMORPHOUS SILICON FILMS [J].

BRODSKY, MH ;

TITLE, RS ;

WEISER, K ;

PETTIT, GD .

PHYSICAL REVIEW B, 1970, 1 (06) :2632-&

← 1 2 3 4 5 →