PASSIVATION OF DONORS IN ELECTRON-BEAM LITHOGRAPHICALLY DEFINED NANOSTRUCTURES AFTER METHANE HYDROGEN REACTIVE ION ETCHING

被引:60
作者
CHEUNG, R
THOMAS, S
MCINTYRE, I
WILKINSON, CDW
BEAUMONT, SP
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1988年 / 6卷 / 06期
关键词
D O I
10.1116/1.584143
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
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页码:1911 / 1915
页数:5
相关论文
共 15 条
  • [1] REACTIVE ION ETCHING OF GAAS USING A MIXTURE OF METHANE AND HYDROGEN
    CHEUNG, R
    THOMS, S
    BEAMONT, SP
    DOUGHTY, G
    LAW, V
    WILKINSON, CDW
    [J]. ELECTRONICS LETTERS, 1987, 23 (16) : 857 - 859
  • [2] DONOR NEUTRALIZATION IN GAAS(SI) BY ATOMIC-HYDROGEN
    CHEVALLIER, J
    DAUTREMONTSMITH, WC
    TU, CW
    PEARTON, SJ
    [J]. APPLIED PHYSICS LETTERS, 1985, 47 (02) : 108 - 110
  • [3] REACTIVE ION ETCHING OF GAAS IN A CHLORINE PLASMA
    HU, EL
    HOWARD, RE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1984, 2 (01): : 85 - 88
  • [4] MACKIE SM, 1984, THESIS GLASGOW U
  • [5] SURFACE DAMAGE ON GAAS INDUCED BY REACTIVE ION ETCHING AND SPUTTER ETCHING
    PANG, SW
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (04) : 784 - 787
  • [6] LOW-TEMPERATURE ANNEALED CONTACTS TO VERY THIN GAAS EPILAYERS
    PATRICK, W
    MACKIE, WS
    BEAUMONT, SP
    WILKINSON, CDW
    [J]. APPLIED PHYSICS LETTERS, 1986, 48 (15) : 986 - 988
  • [7] HYDROGENATION OF SHALLOW-DONOR LEVELS IN GAAS
    PEARTON, SJ
    DAUTREMONTSMITH, WC
    CHEVALLIER, J
    TU, CW
    CUMMINGS, KD
    [J]. JOURNAL OF APPLIED PHYSICS, 1986, 59 (08) : 2821 - 2827
  • [8] HYDROGEN IN CRYSTALLINE SEMICONDUCTORS
    PEARTON, SJ
    CORBETT, JW
    SHI, TS
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1987, 43 (03): : 153 - 195
  • [9] FABRICATION OF 20-NM STRUCTURES IN GAAS
    STERN, MB
    CRAIGHEAD, HG
    LIAO, PF
    MANKIEWICH, PM
    [J]. APPLIED PHYSICS LETTERS, 1984, 45 (04) : 410 - 412
  • [10] REACTIVE ION ETCHING OF GAAS AND INP USING SICL4
    STERN, MB
    LIAO, PF
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (04): : 1053 - 1055