ELECTRICAL UNIFORMITY FOR SI-IMPLANTED LAYER OF COMPLETELY DISLOCATION-FREE AND STRIATION-FREE GAAS

被引:20
作者
HYUGA, F
KOHDA, H
NAKANISHI, H
KOBAYASHI, T
HOSHIKAWA, K
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D O I
10.1063/1.96092
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O59 [应用物理学];
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页码:620 / 622
页数:3
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[1]  
COTTRELL AH, 1953, DISLOCATIONS PLASTIC, P56
[2]   EFFECT OF DISLOCATIONS ON SHEET CARRIER CONCENTRATION OF SI-IMPLANTED, SEMI-INSULATING, LIQUID-ENCAPSULATED CZOCHRALSKI GROWN GAAS [J].
HYUGA, F .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1985, 24 (02) :L160-L162
[3]  
KOHDA H, J CRYST GROWTH
[4]   DIRECT OBSERVATION OF DISLOCATION EFFECTS ON THRESHOLD VOLTAGE OF A GAAS FIELD-EFFECT TRANSISTOR [J].
MIYAZAWA, S ;
ISHII, Y ;
ISHIDA, S ;
NANISHI, Y .
APPLIED PHYSICS LETTERS, 1983, 43 (09) :853-855
[5]   SPATIALLY RESOLVED ELECTRICAL AND SPECTROSCOPIC STUDIES AROUND DISLOCATIONS IN GAAS SINGLE-CRYSTALS [J].
WATANABE, K ;
NAKANISHI, H ;
YAMADA, K ;
HOSHIKAWA, K .
APPLIED PHYSICS LETTERS, 1984, 45 (06) :643-645
[6]   SUBSTRATE EFFECTS ON THE THRESHOLD VOLTAGE OF GAAS FIELD-EFFECT TRANSISTORS [J].
WINSTON, HV ;
HUNTER, AT ;
OLSEN, HM ;
BRYAN, RP ;
LEE, RE .
APPLIED PHYSICS LETTERS, 1984, 45 (04) :447-449