DETERMINATION OF INTERFACE AND BULK-TRAP STATES OF IGFETS USING DEEP-LEVEL TRANSIENT SPECTROSCOPY

被引：71

作者：

WANG, KL ^{[1
]}

EVWARAYE, AO ^{[1
]}

机构：

[1] GE, CORP RES & DEV, SCHENECTADY, NY 12301 USA

来源：

JOURNAL OF APPLIED PHYSICS | 1976年 / 47卷 / 10期

关键词：

D O I：

10.1063/1.322381

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：4574 / 4577

页数：4

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