MEASUREMENTS OF THE SEMICONDUCTOR-LASER LINEWIDTH BROADENING FACTOR

被引：122

作者：

HENNING, ID

COLLINS, JV

机构：

来源：

ELECTRONICS LETTERS | 1983年 / 19卷 / 22期

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D O I：

10.1049/el:19830633

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：927 / 929

页数：3

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