HIGH-TEMPERATURE ANNEALING OF IMPLANTED BURIED OXIDE IN SILICON

被引:18
作者
MOGROCAMPERO, A
LOVE, RP
LEWIS, N
HALL, EL
MCCONNELL, MD
机构
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D O I
10.1063/1.337215
中图分类号
O59 [应用物理学];
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页码:2103 / 2105
页数:3
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