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CALCULATION OF SURFACE GENERATION AND RECOMBINATION VELOCITIES AT THE SI-SIO2 INTERFACE
被引:156
作者
:
EADES, WD
论文数:
0
引用数:
0
h-index:
0
EADES, WD
SWANSON, RM
论文数:
0
引用数:
0
h-index:
0
SWANSON, RM
机构
:
来源
:
JOURNAL OF APPLIED PHYSICS
|
1985年
/ 58卷
/ 11期
关键词
:
D O I
:
10.1063/1.335562
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:4267 / 4276
页数:10
相关论文
共 25 条
[21]
SZE SM, 1969, PHYSICS SEMICONDUCTO, P46
[22]
DETERMINATION OF INTERFACE-STATE PARAMETERS IN A MOS CAPACITOR BY DLTS
TREDWELL, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
TREDWELL, TJ
VISWANATHAN, CR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
VISWANATHAN, CR
[J].
SOLID-STATE ELECTRONICS,
1980,
23
(11)
: 1171
-
1178
[23]
INTERFACE-STATE PARAMETER DETERMINATION BY DEEP-LEVEL TRANSIENT SPECTROSCOPY
TREDWELL, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
TREDWELL, TJ
VISWANATHAN, CR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
VISWANATHAN, CR
[J].
APPLIED PHYSICS LETTERS,
1980,
36
(06)
: 462
-
464
[24]
QUENCHED-IN BULK DEFECTS AND INTERFACE STATES IN MOS STRUCTURES MEASURED BY TRANSIENT CAPACITANCE SPECTROSCOPY
WANG, KL
论文数:
0
引用数:
0
h-index:
0
WANG, KL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(10)
: 1664
-
1667
[25]
DEEP LEVEL TRANSIENT SPECTROSCOPY OF BULK TRAPS AND INTERFACE STATES IN SI MOS DIODES
YAMASAKI, K
论文数:
0
引用数:
0
h-index:
0
机构:
SCI UNIV TOKYO,FAC SCI,DEPT PHYS,SHINJUKU KU,TOKYO 162,JAPAN
SCI UNIV TOKYO,FAC SCI,DEPT PHYS,SHINJUKU KU,TOKYO 162,JAPAN
YAMASAKI, K
YOSHIDA, M
论文数:
0
引用数:
0
h-index:
0
机构:
SCI UNIV TOKYO,FAC SCI,DEPT PHYS,SHINJUKU KU,TOKYO 162,JAPAN
SCI UNIV TOKYO,FAC SCI,DEPT PHYS,SHINJUKU KU,TOKYO 162,JAPAN
YOSHIDA, M
SUGANO, T
论文数:
0
引用数:
0
h-index:
0
机构:
SCI UNIV TOKYO,FAC SCI,DEPT PHYS,SHINJUKU KU,TOKYO 162,JAPAN
SCI UNIV TOKYO,FAC SCI,DEPT PHYS,SHINJUKU KU,TOKYO 162,JAPAN
SUGANO, T
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1979,
18
(01)
: 113
-
122
←
1
2
3
→
共 25 条
[21]
SZE SM, 1969, PHYSICS SEMICONDUCTO, P46
[22]
DETERMINATION OF INTERFACE-STATE PARAMETERS IN A MOS CAPACITOR BY DLTS
TREDWELL, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
TREDWELL, TJ
VISWANATHAN, CR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
VISWANATHAN, CR
[J].
SOLID-STATE ELECTRONICS,
1980,
23
(11)
: 1171
-
1178
[23]
INTERFACE-STATE PARAMETER DETERMINATION BY DEEP-LEVEL TRANSIENT SPECTROSCOPY
TREDWELL, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
TREDWELL, TJ
VISWANATHAN, CR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
UNIV CALIF LOS ANGELES,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024
VISWANATHAN, CR
[J].
APPLIED PHYSICS LETTERS,
1980,
36
(06)
: 462
-
464
[24]
QUENCHED-IN BULK DEFECTS AND INTERFACE STATES IN MOS STRUCTURES MEASURED BY TRANSIENT CAPACITANCE SPECTROSCOPY
WANG, KL
论文数:
0
引用数:
0
h-index:
0
WANG, KL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(10)
: 1664
-
1667
[25]
DEEP LEVEL TRANSIENT SPECTROSCOPY OF BULK TRAPS AND INTERFACE STATES IN SI MOS DIODES
YAMASAKI, K
论文数:
0
引用数:
0
h-index:
0
机构:
SCI UNIV TOKYO,FAC SCI,DEPT PHYS,SHINJUKU KU,TOKYO 162,JAPAN
SCI UNIV TOKYO,FAC SCI,DEPT PHYS,SHINJUKU KU,TOKYO 162,JAPAN
YAMASAKI, K
YOSHIDA, M
论文数:
0
引用数:
0
h-index:
0
机构:
SCI UNIV TOKYO,FAC SCI,DEPT PHYS,SHINJUKU KU,TOKYO 162,JAPAN
SCI UNIV TOKYO,FAC SCI,DEPT PHYS,SHINJUKU KU,TOKYO 162,JAPAN
YOSHIDA, M
SUGANO, T
论文数:
0
引用数:
0
h-index:
0
机构:
SCI UNIV TOKYO,FAC SCI,DEPT PHYS,SHINJUKU KU,TOKYO 162,JAPAN
SCI UNIV TOKYO,FAC SCI,DEPT PHYS,SHINJUKU KU,TOKYO 162,JAPAN
SUGANO, T
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1979,
18
(01)
: 113
-
122
←
1
2
3
→