COMPARISON OF GROUP-4 AND GROUP-6 DOPING BY IMPLANTATION IN GAAS

被引:23
作者
DAVIES, DE [1 ]
KENNEDY, JK [1 ]
LUDINGTON, CE [1 ]
机构
[1] USAF,SYST COMMAND,RES LABS,BEDFORD,MA 01730
关键词
D O I
10.1149/1.2134020
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:1374 / 1377
页数:4
相关论文
共 10 条
  • [1] ALLEN RM, 1970, EUROPEAN C ION IMPLA, P126
  • [2] ROLE OF ELEVATED-TEMPERATURES IN IMPLANTATION OF GAAS
    DAVIES, DE
    ROOSILD, S
    LOWE, L
    [J]. SOLID-STATE ELECTRONICS, 1975, 18 (09) : 733 - 736
  • [3] COMPENSATION FROM IMPLANTATION IN GAAS
    DAVIES, DE
    KENNEDY, JK
    YANG, AC
    [J]. APPLIED PHYSICS LETTERS, 1973, 23 (11) : 615 - 616
  • [4] EISEN FH, 1974, 4TH INT C ION IMPL O
  • [5] EISEN FH, 1973, ION IMPLANTATION SEM, P631
  • [6] EFFICIENT DOPING OF GAAS BY SE+ ION IMPLANTATION
    FOYT, AG
    DONNELLY, JP
    LINDLEY, WT
    [J]. APPLIED PHYSICS LETTERS, 1969, 14 (12) : 372 - &
  • [7] OUTDIFFUSION THROUGH SILICON OXIDE AND SILICON NITRIDE LAYERS ON GALLIUM ARSENIDE
    GYULAI, J
    MAYER, JW
    MITCHELL, IV
    RODRIGUEZ, V
    [J]. APPLIED PHYSICS LETTERS, 1970, 17 (08) : 332 - +
  • [8] INFLUENCE OF IMPLANTATION TEMPERATURE AND SURFACE PROTECTION ON TELLURIUM IMPLANTATION IN GAAS
    HARRIS, JS
    MAYER, JW
    EISEN, FH
    HASKELL, JD
    WELCH, B
    PASHLEY, RD
    [J]. APPLIED PHYSICS LETTERS, 1972, 21 (12) : 601 - &
  • [9] HALL-EFFECT MEASUREMENTS OF ZN IMPLANTED GAAS
    YUBA, Y
    GAMO, K
    MASUDA, K
    NAMBA, S
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, 13 (04) : 641 - 644
  • [10] ZELEVINSKAYA VM, 1971, SOV PHYS SEMICOND+, V4, P1529