TEMPERATURE-DEPENDENCE OF DEGREE OF DOPING IN GROWTH OF SILICON EPITAXIAL LAYERS FROM GAS-PHASE .1. PHOSPHORUS CONTENT AND NATURE OF SEGREGATION COEFFICIENT

被引:6
作者
KUHNE, H
机构
来源
KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY | 1978年 / 13卷 / 08期
关键词
D O I
10.1002/crat.19780130809
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:939 / 946
页数:8
相关论文
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[3]   TEMPERATURE-DEPENDENCE OF DEGREE OF DOPING IN GROWTH OF SILICON EPITAXIAL LAYERS FROM GAS-PHASE .2. PHOSPHORUS CONTENT AND VALUES OF DIFFERENTIAL MOLAR SOLUTION ENTHALPIES [J].
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[4]   RELATIONSHIP BETWEEN RESISTIVITY AND PHOSPHORUS CONCENTRATION IN SILICON [J].
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RAICHOUDHURY P, 1969, J CRYST GROWTH, V7, P1811
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