CORRELATION BETWEEN TEMPERATURE AND DOSE-RATE DEPENDENCE OF SEMICONDUCTOR RESPONSE - INFLUENCE OF ACCUMULATED DOSE

被引:43
作者
VANDAM, J
LEUNENS, G
DUTREIX, A
机构
[1] Department of Radiotherapy, University Hospital St. Rafaël, Leuven
关键词
INVIVO DOSIMETRY; DIODES; QUALITY ASSURANCE;
D O I
10.1016/0167-8140(90)90035-U
中图分类号
R73 [肿瘤学];
学科分类号
100214 ;
摘要
The temperature and dose per pulse dependence of 20 Therados semiconductor detectors have been investigated. The rise in relative response observed when increasing temperature from 20-degrees-C to 32-degrees-C ranges between 1.00 and 1.07, that observed when increasing dose per pulse from 9.8 x 10(-6) to 6.5 x 10(-4) Gy/pulse between 1.01 and 1.11. The diodes with the most pronounced dose per pulse dependence have also the most pronounced temperature dependence. Accumulated dose has been found to increase both temperature and dose per pulse dependence until a level off dose ( < 4 kGy for one of the diodes) is reached. However, no level off has been observed concerning sensitivity decrease with dose: after an accumulated dose of 29 kGy a sensitivity decrease of 65% was still observed when given another 25 kGy to one of the diodes.
引用
收藏
页码:345 / 351
页数:7
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