THE EVOLUTION OF THE MINIMOS MOBILITY MODEL

被引:64
作者
SELBERHERR, S
HANSCH, W
SEAVEY, M
SLOTBOOM, J
机构
[1] SIEMENS AG,RES LABS,W-8000 MUNICH 83,GERMANY
[2] DIGITAL EQUIPMENT CORP,HUDSON,MA 01749
[3] PHILIPS RES LABS,5600 JA EINDHOVEN,NETHERLANDS
关键词
D O I
10.1016/0038-1101(90)90117-W
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 [电气工程]; 0809 [电子科学与技术];
摘要
The paper reviews the evolution of the mobility model of the MINIMOS program for the two-dimensional simulation of miniaturized MOS devices over a period of 10 years. © 1990.
引用
收藏
页码:1425 / 1436
页数:12
相关论文
共 46 条
[1]
VELOCITY-FIELD PROFILE OF NORMAL-SILICON - A THEORETICAL-ANALYSIS [J].
AHMAD, N ;
ARORA, VK .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (07) :1075-1077
[2]
OPTIMUM CRYSTALLOGRAPHIC ORIENTATION OF SUBMICROMETER CMOS DEVICES OPERATED AT LOW-TEMPERATURES [J].
AOKI, M ;
YANO, K ;
MASUHARA, T ;
IKEDA, S ;
MEGURO, S .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1987, 34 (01) :52-57
[3]
AOKI M, 1985, P INT ELECTRON DEVIC, P577
[4]
ELECTRON AND HOLE MOBILITIES IN SILICON AS A FUNCTION OF CONCENTRATION AND TEMPERATURE [J].
ARORA, ND ;
HAUSER, JR ;
ROULSTON, DJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (02) :292-295
[5]
A SEMIEMPIRICAL MODEL OF THE MOSFET INVERSION LAYER MOBILITY FOR LOW-TEMPERATURE OPERATION [J].
ARORA, ND ;
GILDENBLAT, GS .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1987, 34 (01) :89-93
[6]
TRANSCONDUCTANCE DEGRADATION IN THIN-OXIDE MOSFETS [J].
BACCARANI, G ;
WORDEMAN, MR .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (10) :1295-1304
[7]
CHARGE-SHEET MODEL OF MOSFET [J].
BREWS, JR .
SOLID-STATE ELECTRONICS, 1978, 21 (02) :345-355
[8]
BROOKS H, 1951, PHYS REV, V83, P879
[9]
SATURATION VALUES OF ELECTRON DRIFT VELOCITY IN SILICON BETWEEN 300 DEGREES K AND 4.2 DEGREES K [J].
CANALI, C ;
OTTAVIANI, G .
PHYSICS LETTERS A, 1970, A 32 (03) :147-+
[10]
ELECTRON AND HOLE DRIFT VELOCITY-MEASUREMENTS IN SILICON AND THEIR EMPIRICAL RELATION TO ELECTRIC-FIELD AND TEMPERATURE [J].
CANALI, C ;
MAJNI, G ;
MINDER, R ;
OTTAVIANI, G .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1975, 22 (11) :1045-1047