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THE EVOLUTION OF THE MINIMOS MOBILITY MODEL
被引:64
作者
:
SELBERHERR, S
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,RES LABS,W-8000 MUNICH 83,GERMANY
SELBERHERR, S
HANSCH, W
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,RES LABS,W-8000 MUNICH 83,GERMANY
HANSCH, W
SEAVEY, M
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,RES LABS,W-8000 MUNICH 83,GERMANY
SEAVEY, M
SLOTBOOM, J
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,RES LABS,W-8000 MUNICH 83,GERMANY
SLOTBOOM, J
机构
:
[1]
SIEMENS AG,RES LABS,W-8000 MUNICH 83,GERMANY
[2]
DIGITAL EQUIPMENT CORP,HUDSON,MA 01749
[3]
PHILIPS RES LABS,5600 JA EINDHOVEN,NETHERLANDS
来源
:
SOLID-STATE ELECTRONICS
|
1990年
/ 33卷
/ 11期
关键词
:
D O I
:
10.1016/0038-1101(90)90117-W
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808
[电气工程]
;
0809
[电子科学与技术]
;
摘要
:
The paper reviews the evolution of the mobility model of the MINIMOS program for the two-dimensional simulation of miniaturized MOS devices over a period of 10 years. © 1990.
引用
收藏
页码:1425 / 1436
页数:12
相关论文
共 46 条
[1]
VELOCITY-FIELD PROFILE OF NORMAL-SILICON - A THEORETICAL-ANALYSIS
[J].
AHMAD, N
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
AHMAD, N
;
ARORA, VK
论文数:
0
引用数:
0
h-index:
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机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
ARORA, VK
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1986,
33
(07)
:1075
-1077
[2]
OPTIMUM CRYSTALLOGRAPHIC ORIENTATION OF SUBMICROMETER CMOS DEVICES OPERATED AT LOW-TEMPERATURES
[J].
AOKI, M
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
AOKI, M
;
YANO, K
论文数:
0
引用数:
0
h-index:
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机构:
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
YANO, K
;
MASUHARA, T
论文数:
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引用数:
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h-index:
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HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
MASUHARA, T
;
IKEDA, S
论文数:
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HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
IKEDA, S
;
MEGURO, S
论文数:
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引用数:
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h-index:
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机构:
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
MEGURO, S
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1987,
34
(01)
:52
-57
[3]
AOKI M, 1985, P INT ELECTRON DEVIC, P577
[4]
ELECTRON AND HOLE MOBILITIES IN SILICON AS A FUNCTION OF CONCENTRATION AND TEMPERATURE
[J].
ARORA, ND
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
ARORA, ND
;
HAUSER, JR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
HAUSER, JR
;
ROULSTON, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
ROULSTON, DJ
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(02)
:292
-295
[5]
A SEMIEMPIRICAL MODEL OF THE MOSFET INVERSION LAYER MOBILITY FOR LOW-TEMPERATURE OPERATION
[J].
ARORA, ND
论文数:
0
引用数:
0
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ARORA, ND
;
GILDENBLAT, GS
论文数:
0
引用数:
0
h-index:
0
GILDENBLAT, GS
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1987,
34
(01)
:89
-93
[6]
TRANSCONDUCTANCE DEGRADATION IN THIN-OXIDE MOSFETS
[J].
BACCARANI, G
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
BACCARANI, G
;
WORDEMAN, MR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
WORDEMAN, MR
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1983,
30
(10)
:1295
-1304
[7]
CHARGE-SHEET MODEL OF MOSFET
[J].
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
BREWS, JR
.
SOLID-STATE ELECTRONICS,
1978,
21
(02)
:345
-355
[8]
BROOKS H, 1951, PHYS REV, V83, P879
[9]
SATURATION VALUES OF ELECTRON DRIFT VELOCITY IN SILICON BETWEEN 300 DEGREES K AND 4.2 DEGREES K
[J].
CANALI, C
论文数:
0
引用数:
0
h-index:
0
CANALI, C
;
OTTAVIANI, G
论文数:
0
引用数:
0
h-index:
0
OTTAVIANI, G
.
PHYSICS LETTERS A,
1970,
A 32
(03)
:147
-+
[10]
ELECTRON AND HOLE DRIFT VELOCITY-MEASUREMENTS IN SILICON AND THEIR EMPIRICAL RELATION TO ELECTRIC-FIELD AND TEMPERATURE
[J].
CANALI, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
CANALI, C
;
MAJNI, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
MAJNI, G
;
MINDER, R
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
MINDER, R
;
OTTAVIANI, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
OTTAVIANI, G
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1975,
22
(11)
:1045
-1047
←
1
2
3
4
5
→
共 46 条
[1]
VELOCITY-FIELD PROFILE OF NORMAL-SILICON - A THEORETICAL-ANALYSIS
[J].
AHMAD, N
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
AHMAD, N
;
ARORA, VK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
ARORA, VK
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1986,
33
(07)
:1075
-1077
[2]
OPTIMUM CRYSTALLOGRAPHIC ORIENTATION OF SUBMICROMETER CMOS DEVICES OPERATED AT LOW-TEMPERATURES
[J].
AOKI, M
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
AOKI, M
;
YANO, K
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
YANO, K
;
MASUHARA, T
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
MASUHARA, T
;
IKEDA, S
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
IKEDA, S
;
MEGURO, S
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
HITACHI LTD, MUSASHI WORKS, KODAIRA, TOKYO 185, JAPAN
MEGURO, S
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1987,
34
(01)
:52
-57
[3]
AOKI M, 1985, P INT ELECTRON DEVIC, P577
[4]
ELECTRON AND HOLE MOBILITIES IN SILICON AS A FUNCTION OF CONCENTRATION AND TEMPERATURE
[J].
ARORA, ND
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
ARORA, ND
;
HAUSER, JR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
HAUSER, JR
;
ROULSTON, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
ROULSTON, DJ
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(02)
:292
-295
[5]
A SEMIEMPIRICAL MODEL OF THE MOSFET INVERSION LAYER MOBILITY FOR LOW-TEMPERATURE OPERATION
[J].
ARORA, ND
论文数:
0
引用数:
0
h-index:
0
ARORA, ND
;
GILDENBLAT, GS
论文数:
0
引用数:
0
h-index:
0
GILDENBLAT, GS
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1987,
34
(01)
:89
-93
[6]
TRANSCONDUCTANCE DEGRADATION IN THIN-OXIDE MOSFETS
[J].
BACCARANI, G
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
BACCARANI, G
;
WORDEMAN, MR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
WORDEMAN, MR
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1983,
30
(10)
:1295
-1304
[7]
CHARGE-SHEET MODEL OF MOSFET
[J].
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
BREWS, JR
.
SOLID-STATE ELECTRONICS,
1978,
21
(02)
:345
-355
[8]
BROOKS H, 1951, PHYS REV, V83, P879
[9]
SATURATION VALUES OF ELECTRON DRIFT VELOCITY IN SILICON BETWEEN 300 DEGREES K AND 4.2 DEGREES K
[J].
CANALI, C
论文数:
0
引用数:
0
h-index:
0
CANALI, C
;
OTTAVIANI, G
论文数:
0
引用数:
0
h-index:
0
OTTAVIANI, G
.
PHYSICS LETTERS A,
1970,
A 32
(03)
:147
-+
[10]
ELECTRON AND HOLE DRIFT VELOCITY-MEASUREMENTS IN SILICON AND THEIR EMPIRICAL RELATION TO ELECTRIC-FIELD AND TEMPERATURE
[J].
CANALI, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
CANALI, C
;
MAJNI, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
MAJNI, G
;
MINDER, R
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
MINDER, R
;
OTTAVIANI, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
UNIV MODENA, IST FIS, VIA UNIVERSITA 4, MODENA, ITALY
OTTAVIANI, G
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1975,
22
(11)
:1045
-1047
←
1
2
3
4
5
→