X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF COPPER-CONTAINING AMORPHOUS-CARBON

被引：10

作者：

CHEN, PA

机构：

[1] Electronic Division, Chung Shan Institute of Science and Technology, Lungtan

来源：

THIN SOLID FILMS | 1991年 / 204卷 / 02期

关键词：

D O I：

10.1016/0040-6090(91)90080-H

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray photoelectron spectroscopy of core states and the valence band density of states of samples, including copper-containing amorphous carbon (a-C:Cu), are presented. New structures were found, resulting from the hybridization of copper d electrons and the valence electrons of carbon. Using data obtained from core states, the values of binding energy linewidth of the Cu 3d band, a model for the electronic bonding configuration of a-C:Cu is proposed.

引用

收藏

页码：413 / 416

页数：4

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