FABRICATION OF METALLIC NANOWIRES WITH A SCANNING TUNNELING MICROSCOPE

被引:76
作者
KRAMER, N
BIRK, H
JORRITSMA, J
SCHONENBERGER, C
机构
[1] UNIV TWENTE,ENSCHEDE,NETHERLANDS
[2] PHILIPS RES LABS,5656 AA EINDHOVEN,NETHERLANDS
关键词
D O I
10.1063/1.113230
中图分类号
O59 [应用物理学];
学科分类号
摘要
A procedure to pattern thin metal films on a nanometer scale with a scanning tunneling microscope (STM) operating in air is reported. A 30 nm film of hydrogenated amorphous silicon (a-Si:H) is deposited on a 10 nm film of TaIr. Applying a negative voltage between the STM tip and the a-Si:H film causes the local oxidation of a-Si:H. The oxide which is formed is used as a mask to wet etch the not-oxidized a-Si:H and subsequently, the remaining pattern is transferred into the metal film by Ar ion milling. Metal wires as narrow as 40 nm have been fabricated. Since a-Si:H can be deposited in very thin layers on almost any substrate, the presented procedure can be applied to structure all kind of thin films on a nanometer scale.© 1995 American Institute of Physics.
引用
收藏
页码:1325 / 1327
页数:3
相关论文
共 14 条
[1]   WEAK LOCALIZATION IN THIN-FILMS - A TIME-OF-FLIGHT EXPERIMENT WITH CONDUCTION ELECTRONS [J].
BERGMANN, G .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1984, 107 (01) :1-58
[2]  
DAGATA JA, 1990, APPL PHYS LETT, V58, P2001
[3]   SUB-30-NM LITHOGRAPHY IN A NEGATIVE ELECTRON-BEAM RESIST WITH A VACUUM SCANNING TUNNELING MICROSCOPE [J].
DOBISZ, EA ;
MARRIAN, CRK .
APPLIED PHYSICS LETTERS, 1991, 58 (22) :2526-2528
[4]   DIRECT WRITING WITH THE SCANNING TUNNELING MICROSCOPE [J].
EHRICHS, EE ;
SILVER, RM ;
DELOZANNE, AL .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :540-543
[5]   4-PROBE RESISTANCE MEASUREMENTS OF NICKEL WIRES WRITTEN WITH A SCANNING TUNNELING MICROSCOPE SCANNING ELECTRON-MICROSCOPE SYSTEM [J].
EHRICHS, EE ;
SMITH, WF ;
DELOZANNE, AL .
ULTRAMICROSCOPY, 1992, 42 :1438-1442
[6]   NANOSCALE PATTERNING AND OXIDATION OF H-PASSIVATED SI(100)-2X1 SURFACES WITH AN ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE [J].
LYDING, JW ;
SHEN, TC ;
HUBACEK, JS ;
TUCKER, JR ;
ABELN, GC .
APPLIED PHYSICS LETTERS, 1994, 64 (15) :2010-2012
[7]   ELECTRON-BEAM LITHOGRAPHY WITH THE SCANNING TUNNELING MICROSCOPE [J].
MARRIAN, CRK ;
DOBISZ, EA ;
DAGATA, JA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1992, 10 (06) :2877-2881
[8]   LITHOGRAPHY WITH THE SCANNING TUNNELING MICROSCOPE [J].
MCCORD, MA ;
PEASE, RFW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (01) :86-88
[9]   LIFT-OFF METALLIZATION USING POLY(METHYL METHACRYLATE) EXPOSED WITH A SCANNING TUNNELING MICROSCOPE [J].
MCCORD, MA ;
PEASE, RFW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (01) :293-296
[10]   FABRICATION OF 0.1-MU-M METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS WITH THE ATOMIC-FORCE MICROSCOPE [J].
MINNE, SC ;
SOH, HT ;
FLUECKIGER, P ;
QUATE, CF .
APPLIED PHYSICS LETTERS, 1995, 66 (06) :703-705