THE EFFICIENT SIMULATION OF COUPLED POINT-DEFECT AND IMPURITY DIFFUSION

被引：27

作者：

KUMP, MR ^{[1
]}

DUTTON, RW ^{[1
]}

机构：

[1] STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305

来源：

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1988年 / 7卷 / 02期

关键词：

D O I：

10.1109/43.3149

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：191 / 204

页数：14

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