WHITE BEAM, X-RAY, ENERGY-DISPERSIVE DIFFRACTOMETRY USING SYNCHROTRON RADIATION

被引：12

作者：

BURAS, B

OLSEN, JS

GERWARD, L

机构：

[1] UNIV COPENHAGEN,PHYS 2 LAB,DK-2100 COPENHAGEN O,DENMARK

[2] TECH UNIV DENMARK,APPL PHYS LAB 3,DK-2800 LYNGBY,DENMARK

来源：

NUCLEAR INSTRUMENTS & METHODS | 1978年 / 152卷 / 01期

关键词：

D O I：

10.1016/0029-554X(78)90282-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：293 / 296

页数：4

共 10 条

[1] SMALL-ANGLE SCATTERING EXPERIMENTS ON BIOLOGICAL-MATERIALS USING SYNCHROTRON RADIATION
BORDAS, J
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GLAZER, AM
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[2] ENERGY-DISPERSIVE DIFFRACTION FROM POLYCRYSTALLINE MATERIALS USING SYNCHROTRON RADIATION
BORDAS, J
GLAZER, AM
HOWARD, CJ
BOURDILLON, AJ
[J]. PHILOSOPHICAL MAGAZINE, 1977, 35 (02): : 311 - 323
[3] X-RAY ENERGY-DISPERSIVE POWDER DIFFRACTOMETRY USING SYNCHROTRON RADIATION
BURAS, B
OLSEN, JS
GERWARD, L
[J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 135 (01): : 193 - 195
[4] X-RAY ENERGY-DISPERSIVE DIFFRACTOMETRY USING SYNCHROTRON RADIATION
BURAS, B
OLSEN, JS
GERWARD, L
WILL, G
HINZE, E
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (DEC) : 431 - 438
[5] BURAS B, J APPL CRYST
[6] BURAS B, 1968, 894IIPS I NUCL RES R
[7] X-RAY DIFFRACTION - NEW HIGH-SPEED TECHNIQUE BASED ON X-RAY SPECTROGRAPHY
GIESSEN, BC
GORDON, GE
[J]. SCIENCE, 1968, 159 (3818) : 973 - &
[8] SI(LI) SEMICONDUCTOR DETECTOR IN ANGLE AND ENERGY DISPERSIVE-X-RAY DIFFRACTOMETRY
LAINE, E
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HAMALAIN.M
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (11): : 951 - 954
[9] ANALYSIS OF TRANSIENT PHENOMENA IN CRYSTALLINE AND LIQUID STRUCTURES USING NEUTRON TIME-OF-FLIGHT TECHNIQUES
NIIMURA, N
MUTO, M
[J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 126 (01): : 87 - 92
[10] VAZINA AA, 1976, REPORT WSIESOJUZNYI, V8, P242