QUANTITATIVE COMPARISON OF SOLID-STATE MICROWAVE DETECTORS

[1] TUNNELING CURRENT IN ESAKI DIODES [J]. PHYSICAL REVIEW, 1961, 121 (04): : 1070 - &

[2] BOSCH BG, 1961, P IRE, V49, P1226

[3] THE EVALUATION OF ESAKI INTEGRALS AND AN APPROXIMATE EXPRESSION FOR THE TUNNEL-DIODE CHARACTERISTIC [J]. SOLID-STATE ELECTRONICS, 1961, 2 (04) : 209 - 215

[4] DEVIATIONS FROM OHMS LAW IN GERMANIUM AND SILICON [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1961, 19 (3-4) : 218 - 227

[5] BURRUS CA, 1963, IEEE T MICROW THEORY, V11, P357

[6] CHASE PE, 1963, IEEE T, VMT11, P560

[7] Eng S. T., 1961, IRE T MICROWAVE THEO, V9, P419

[8] NEW PHENOMENON IN NARROW GERMANIUM PARA-NORMAL-JUNCTIONS [J]. PHYSICAL REVIEW, 1958, 109 (02): : 603 - 604

[9] FOLLMER WC, 1961, P IRE, V49, P1939

[10] HOT-CARRIER MICROWAVE DETECTOR [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (04): : 588 - &

[1] TUNNELING CURRENT IN ESAKI DIODES [J]. PHYSICAL REVIEW, 1961, 121 (04): : 1070 - &

[2] BOSCH BG, 1961, P IRE, V49, P1226

[3] THE EVALUATION OF ESAKI INTEGRALS AND AN APPROXIMATE EXPRESSION FOR THE TUNNEL-DIODE CHARACTERISTIC [J]. SOLID-STATE ELECTRONICS, 1961, 2 (04) : 209 - 215

[4] DEVIATIONS FROM OHMS LAW IN GERMANIUM AND SILICON [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1961, 19 (3-4) : 218 - 227

[5] BURRUS CA, 1963, IEEE T MICROW THEORY, V11, P357

[6] CHASE PE, 1963, IEEE T, VMT11, P560

[7] Eng S. T., 1961, IRE T MICROWAVE THEO, V9, P419

[8] NEW PHENOMENON IN NARROW GERMANIUM PARA-NORMAL-JUNCTIONS [J]. PHYSICAL REVIEW, 1958, 109 (02): : 603 - 604

[9] FOLLMER WC, 1961, P IRE, V49, P1939

[10] HOT-CARRIER MICROWAVE DETECTOR [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (04): : 588 - &