SPATIAL-MAPPING OF ELECTRICALLY ACTIVE DEFECTS IN HGCDTE USING LASER BEAM-INDUCED CURRENT

被引：55

作者：

BAJAJ, J ^{[1
]}

BUBULAC, LO ^{[1
]}

NEWMAN, PR ^{[1
]}

TENNANT, WE ^{[1
]}

RACCAH, PM ^{[1
]}

机构：

[1] UNIV ILLINOIS,DEPT PHYS,CHICAGO,IL 60680

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 05期

关键词：

D O I：

10.1116/1.574834

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：3186 / 3189

页数：4

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