ION-IMPLANTATION STUDY OF HGCDTE

[1] SECONDARY ION MASS ANALYSIS - TECHNIQUE FOR 3-DIMENSIONAL CHARACTERIZATION [J]. ANALYTICAL CHEMISTRY, 1972, 44 (13) : A67 - &

[2] HG-IMPLANTED HG1-XCDXTE INFRARED PHOTOVOLTAIC DETECTORS IN 8- TO 14-MU-M RANGE [J]. APPLIED PHYSICS LETTERS, 1973, 23 (08) : 448 - 449

[3] TYPE CONVERSION AND N-P JUNCTION FORMATION IN HG1-XCDXTE PRODUCED BY PROTON BOMBARDMENT [J]. APPLIED PHYSICS LETTERS, 1971, 18 (08) : 321 - &

[4] GIBBONS JF, PROJECTED RANGE STAT, pCH4

[5] JOHSON ES, 1977, J ELECTRONIC MATERIA, V6, P25

[6] BACKSIDE-ILLUMINATED HGCDTE-CDTE PHOTO-DIODES [J]. APPLIED PHYSICS LETTERS, 1979, 34 (01) : 50 - 52

[7] INFRARED PHOTOVOLTAIC DETECTORS FROM ION-IMPLANTED CDXHG1-XTE [J]. APPLIED PHYSICS LETTERS, 1973, 23 (08) : 450 - 452

[8] MOLL JL, 1964, PHYSICS SEMICONDUCTO, pCH7

[9] ANODIC-OXIDATION OF GAAS AS A TECHNIQUE TO EVALUATE ELECTRICAL CARRIER CONCENTRATION PROFILES [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (05) : 651 - 655

[10] DIFFUSION LENGTH DETERMINATION IN THIN-FILM CUXS-CDS SOLAR-CELLS BY SCANNING ELECTRON-MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1977, 48 (06) : 2548 - 2555

[1] SECONDARY ION MASS ANALYSIS - TECHNIQUE FOR 3-DIMENSIONAL CHARACTERIZATION [J]. ANALYTICAL CHEMISTRY, 1972, 44 (13) : A67 - &

[2] HG-IMPLANTED HG1-XCDXTE INFRARED PHOTOVOLTAIC DETECTORS IN 8- TO 14-MU-M RANGE [J]. APPLIED PHYSICS LETTERS, 1973, 23 (08) : 448 - 449

[3] TYPE CONVERSION AND N-P JUNCTION FORMATION IN HG1-XCDXTE PRODUCED BY PROTON BOMBARDMENT [J]. APPLIED PHYSICS LETTERS, 1971, 18 (08) : 321 - &

[4] GIBBONS JF, PROJECTED RANGE STAT, pCH4

[5] JOHSON ES, 1977, J ELECTRONIC MATERIA, V6, P25

[6] BACKSIDE-ILLUMINATED HGCDTE-CDTE PHOTO-DIODES [J]. APPLIED PHYSICS LETTERS, 1979, 34 (01) : 50 - 52

[7] INFRARED PHOTOVOLTAIC DETECTORS FROM ION-IMPLANTED CDXHG1-XTE [J]. APPLIED PHYSICS LETTERS, 1973, 23 (08) : 450 - 452

[8] MOLL JL, 1964, PHYSICS SEMICONDUCTO, pCH7

[9] ANODIC-OXIDATION OF GAAS AS A TECHNIQUE TO EVALUATE ELECTRICAL CARRIER CONCENTRATION PROFILES [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (05) : 651 - 655

[10] DIFFUSION LENGTH DETERMINATION IN THIN-FILM CUXS-CDS SOLAR-CELLS BY SCANNING ELECTRON-MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1977, 48 (06) : 2548 - 2555