GAAS ON SI AND RELATED SYSTEMS - PROBLEMS AND PROSPECTS

被引:102
作者
KROEMER, H [1 ]
LIU, TY [1 ]
PETROFF, PM [1 ]
机构
[1] UNIV CALIF SANTA BARBARA,DEPT MAT,SANTA BARBARA,CA 93106
关键词
D O I
10.1016/0022-0248(89)90359-X
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:96 / 102
页数:7
相关论文
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  • [1] AHEARN J, COMMUNICATION
  • [2] BIATOMIC STEPS ON (001) SILICON SURFACES
    ASPNES, DE
    IHM, J
    [J]. PHYSICAL REVIEW LETTERS, 1986, 57 (24) : 3054 - 3057
  • [3] LOW-THRESHOLD (APPROXIMATELY-600 A/CM2 AT ROOM-TEMPERATURE) GAAS/AIGAAS LASERS ON SI (100)
    CHEN, HZ
    GHAFFARI, A
    WANG, H
    MORKOC, H
    YARIV, A
    [J]. APPLIED PHYSICS LETTERS, 1987, 51 (17) : 1320 - 1321
  • [4] EFFECTIVENESS OF STRAINED-LAYER SUPERLATTICES IN REDUCING DEFECTS IN GAAS EPILAYERS GROWN ON SILICON SUBSTRATES
    ELMASRY, N
    TARN, JCL
    HUMPHREYS, TP
    HAMAGUCHI, N
    KARAM, NH
    BEDAIR, SM
    [J]. APPLIED PHYSICS LETTERS, 1987, 51 (20) : 1608 - 1610
  • [5] FAN JCC, 1986, MATERIALS RES SOC P, V67
  • [6] FAN JCC, 1987, MATERIALS RES SOC P, V91
  • [7] MICROWAVE PROPERTIES OF SELF-ALIGNED GAAS/ALGAAS HETEROJUNCTION BIPOLAR-TRANSISTORS ON SILICON SUBSTRATES
    FISCHER, R
    KLEM, J
    PENG, CK
    GEDYMIN, JS
    MORKOC, H
    [J]. IEEE ELECTRON DEVICE LETTERS, 1986, 7 (02) : 112 - 114
  • [8] MATERIAL PROPERTIES OF HIGH-QUALITY GAAS EPITAXIAL LAYERS GROWN ON SI SUBSTRATES
    FISCHER, R
    MORKOC, H
    NEUMANN, DA
    ZABEL, H
    CHOI, C
    OTSUKA, N
    LONGERBONE, M
    ERICKSON, LP
    [J]. JOURNAL OF APPLIED PHYSICS, 1986, 60 (05) : 1640 - 1647
  • [9] GAAS BIPOLAR-TRANSISTORS GROWN ON (100) SI SUBSTRATES BY MOLECULAR-BEAM EPITAXY
    FISCHER, R
    CHAND, N
    KOPP, W
    MORKOC, H
    ERICKSON, LP
    YOUNGMAN, R
    [J]. APPLIED PHYSICS LETTERS, 1985, 47 (04) : 397 - 399
  • [10] ELIMINATION OF INTERFACE DEFECTS IN MISMATCHED EPILAYERS BY A REDUCTION IN GROWTH AREA
    FITZGERALD, EA
    KIRCHNER, PD
    PROANO, R
    PETTIT, GD
    WOODALL, JM
    AST, DG
    [J]. APPLIED PHYSICS LETTERS, 1988, 52 (18) : 1496 - 1498