IMPROVEMENT OF THE HIGH-TEMPERATURE PERFORMANCE OF 1.3-MU-M BURIED HETEROSTRUCTURE LASERS BY THE USE OF AN ALLNAS LAYER TO LIMIT CURRENT LEAKAGE

被引:2
作者
MURRELL, DL
YOUNG, RE
机构
[1] BT Lab., Ipswich
关键词
D O I
10.1088/0268-1242/8/8/029
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The high-temperature performance of 1.3 mum buried heterostructure lasers has been improved to such an extent that they would be suitable for operation without a Peltier cooler. Formation of the hybrid structure used to realize the improvement utilized both metal-organic vapour-phase epitaxy (MOVPE) and molecular beam epitaxy (MBE) growth techniques. A resistive, undoped AlInAs layer grown by MBE was incorporated into the laser structure in order to reduce current leakage around the laser active region. The laser performance was found to be better than that predicted from theoretical considerations.
引用
收藏
页码:1662 / 1665
页数:4
相关论文
共 8 条
[1]  
COOPER DM, 1987, P C LASERS ELECTROOP, P274
[2]   GROWTH AND PROPERTIES OF IN0.52AL0.48AS/IN0.53GA0.47AS, GAAS-IN AND INGAAS GAAS MULTILAYERS [J].
JUANG, FY ;
HONG, WP ;
BERGER, PR ;
BHATTACHARYA, PK ;
DAS, U ;
SINGH, J .
JOURNAL OF CRYSTAL GROWTH, 1987, 81 (1-4) :373-377
[3]  
Nelson A. W., 1986, British Telecom Technology Journal, V4, P85
[4]   GALNAS-ALLNAS STRUCTURES GROWN BY MOLECULAR-BEAM EPITAXY [J].
OHNO, H ;
WOOD, CEC ;
RATHBUN, L ;
MORGAN, DV ;
WICKS, GW ;
EASTMAN, LF .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (06) :4033-4037
[5]   ANALYSIS OF CURRENT LEAKAGE IN INGAASP INP BURIED HETEROSTRUCTURE LASERS [J].
OHTOSHI, T ;
YAMAGUCHI, K ;
CHINONE, N .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1989, 25 (06) :1369-1375
[6]   SUPPRESSION OF LEAKAGE CURRENT IN INGAASP/INP BURIED HETEROSTRUCTURE LASERS BY INAIAS STRAINED CURRENT-BLOCKING LAYERS [J].
OHTOSHI, T ;
CHINONE, N .
ELECTRONICS LETTERS, 1991, 27 (01) :12-13
[7]   INVESTIGATION OF CRYSTALLINE AND OPTICAL-PROPERTIES OF AL0.48IN0.52AS GROWN BY MOLECULAR-BEAM EXPITAXY [J].
PRASEUTH, JP ;
GOLDSTEIN, L ;
HENOC, P ;
PRIMOT, J ;
DANAN, G .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (01) :215-219
[8]  
REDSTALL RM, 1991, INT C THERMOELECTRIC, P242