CHARGE STATES OF 25-150 KEV H AND HE-4 BACKSCATTERED FROM SOLID SURFACES

被引：51

作者：

BUCK, TM ^{[1
]}

WHEATLEY, GH ^{[1
]}

FELDMAN, LC ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

SURFACE SCIENCE | 1973年 / 35卷 / 01期

关键词：

D O I：

10.1016/0039-6028(73)90224-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：345 / 361

页数：17

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共 31 条

[21] MCRAE EG, UNPUBLISHED RESULTS
[22] ANALYSIS OF AMORPHOUS LAYERS ON SILICON BY BACKSCATTERING AND CHANNELING EFFECT MEASUREMENTS
MEYER, O
GYULAI, J
MAYER, JW
[J]. SURFACE SCIENCE, 1970, 22 (02) : 263 - &
[23] CHANNELING-EFFECT ANALYSIS OF THIN FILMS ON SILICON - ALUMINUM OXIDE
MITCHELL, IV
KAMOSHIDA, M
MAYER, JW
[J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (11) : 4378 - +
[24] CHARGE EQUILIBRIUM RATIOS FOR HYDROGEN IONS FROM SOLIDS
PHILLIPS, JA
[J]. PHYSICAL REVIEW, 1955, 97 (02): : 404 - 410
[25] ANALYSIS OF SURFACE COMPOSITION WITH LOW-ENERGY BACKSCATTERED IONS
SMITH, DP
[J]. SURFACE SCIENCE, 1971, 25 (01) : 171 - &
[26] CHARGE EXCHANGE CROSS SECTIONS OF HYDROGEN IONS IN GASES
STIER, PM
BARNETT, CF
[J]. PHYSICAL REVIEW, 1956, 103 (04): : 896 - 907
[27] DETERMINATION OF SURFACE CONTAMINATION ON SILICON BY LARGE ANGLE ION SCATTERING
THOMPSON, DA
BARBER, HD
MACKINTOSH, WD
[J]. APPLIED PHYSICS LETTERS, 1969, 14 (03) : 102 - +
[28] COLLISIONS OF AR+ IONS WITH SURFACE CU ATOMS AND CHARGE EXCHANGE OF SCATTERED IONS NEAR METAL SURFACE
VANDERWEG, WF
BIERMAN, DJ
[J]. PHYSICA, 1969, 44 (02): : 177 - +
[29] BACKSCATTERING OF LIGHT ATOMIC PROJECTILES FROM THIN AU FILMS IN ENERGY RANGE 50-110 KEV
VANWIJNG.A
BRIMNER, EJ
BAYLIS, WE
[J]. CANADIAN JOURNAL OF PHYSICS, 1970, 48 (16) : 1835 - &
[30] ENERGY SPECTRA OF KEV BACKSCATTERED PROTONS AS A PROBE FOR SURFACE-REGION STUDIES
VANWIJNGAARDEN, A
MIREMADE, B
BAYLIS, WE
[J]. CANADIAN JOURNAL OF PHYSICS, 1971, 49 (19) : 2440 - +

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