SURFACE-DEFECTS, GAP STATES, AND LOW-ENERGY MODES OF DEGENERATELY DOPED N-GAAS(110)

被引:10
作者
KILDAY, DG
MARGARITONDO, G
LAPEYRE, GJ
机构
[1] UNIV WISCONSIN,CTR SYNCHROTRON RADIAT,MADISON,WI 53706
[2] MONTANA STATE UNIV,DEPT PHYS,BOZEMAN,MT 59717
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 03期
关键词
D O I
10.1116/1.576662
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We show that information about gap states at semiconductor surfaces and interfaces can be obtained from high-resolution electron energy-loss spectroscopy. This novel approach is based on a careful analysis of low-energy (<0.1 eV) modes, using theoretical spectra derived from a layered spatially dispersive model of the dielectric response. © 1990, American Vacuum Society. All rights reserved.
引用
收藏
页码:2755 / 2760
页数:6
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