THE EFFECT OF COOLING RATE ON THE SURFACE RECONSTRUCTION OF ANNEALED SILICON(111) STUDIED BY SCANNING TUNNELING MICROSCOPY AND LOW-ENERGY ELECTRON-DIFFRACTION

被引：30

作者：

PASHLEY, MD

HABERERN, KW

FRIDAY, W

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575365

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：488 / 492

页数：5

共 18 条

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AUER, PP
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[2] NEW RECONSTRUCTIONS ON SILICON (111) SURFACES
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[3] TUNNELING IMAGES OF ATOMIC STEPS ON THE SI(111)7X7 SURFACE
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SWARTZENTRUBER, BS
[J]. PHYSICAL REVIEW LETTERS, 1985, 55 (19) : 2028 - 2031
[4] THE SI(111) 7X7 TO 1X1 TRANSITION
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[5] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE
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[J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123
[6] A SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES
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WELLAND, ME
[J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (04) : 396 - 402
[7] SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE
HAMERS, RJ
TROMP, RM
DEMUTH, JE
[J]. PHYSICAL REVIEW LETTERS, 1986, 56 (18) : 1972 - 1975
[8] REEXAMINATION OF THE STRUCTURE OF A LASER-STABILIZED SI(111)1X1 SURFACE
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[J]. PHYSICAL REVIEW B, 1986, 33 (06): : 4005 - 4008
[9] SCANNING TUNNELLING MICROSCOPE STUDIES
PASHLEY, MD
PETHICA, JB
COOMBS, J
[J]. SURFACE SCIENCE, 1985, 152 (APR) : 27 - 32
[10] COMPARISON OF HIGH-TEMPERATURE AND LASER-QUENCHED SI(111) USING LOW-ENERGY ELECTRON-DIFFRACTION
PHANEUF, RJ
WILLIAMS, ED
[J]. PHYSICAL REVIEW B, 1987, 35 (08): : 4155 - 4158

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