RECENT ADVANCES IN THE PHYSICS OF SILICON P-N-JUNCTION SOLAR-CELLS INCLUDING THEIR TRANSIENT-RESPONSE

被引:17
作者
JAIN, SC [1 ]
HEASELL, EL [1 ]
ROULSTON, DJ [1 ]
机构
[1] UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
关键词
DARK CURRENTS - HEAVY DOPING EFFECTS - MINORITY CARRIERS - SERIES RESISTANCE - SILICON P-N JUNCTION;
D O I
10.1016/0079-6727(87)90004-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:105 / 204
页数:100
相关论文
共 139 条
[71]   METHODOLOGY FOR EXPERIMENTALLY BASED DETERMINATION OF GAP SHRINKAGE AND EFFECTIVE LIFETIMES IN EMITTER AND BASE OF P-N-JUNCTION SOLAR-CELLS AND OTHER P-N-JUNCTION DEVICES [J].
LINDHOLM, FA ;
NEUGROSCHEL, A ;
SAH, CT ;
GODLEWSKI, MP ;
BRANDHORST, HW .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1977, 24 (04) :402-410
[72]  
Lindmayer J., 1972, 9TH IEEE PHOT SPEC C, P83
[73]   MEASUREMENT OF MINORITY-CARRIER LIFETIME IN SOLAR-CELLS FROM PHOTOINDUCED OPEN-CIRCUIT VOLTAGE DECAY [J].
MAHAN, JE ;
EKSTEDT, TW ;
FRANK, RI ;
KAPLOW, R .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (05) :733-739
[74]  
MANDELKORN J, 1973, 10TH IEEE PHOT SPEC, P207
[75]  
Martinelli R. U., 1976, International Electron Devices Meeting. (Technical digest), P162
[76]   INFLUENCE OF THE WAVELENGTH OF INCIDENT LIGHT ON SHUNT CONDUCTANCE AND FILL FACTOR IN AMORPHOUS-SILICON SOLAR-CELLS [J].
MARUSKA, HP ;
MOUSTAKAS, TD .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (05) :551-558
[77]   A SIPOS-SI HETEROJUNCTION TRANSISTOR [J].
MATSUSHITA, T ;
HAYASHI, H ;
NORIKAZU, OU ;
YAMOTO, H .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (01) :75-81
[78]   MEASUREMENT OF THE DEPT OF DIFFUSED LAYERS IN SILICON BY THE GROOVING METHOD [J].
MCDONALD, B ;
GOETZBERGER, A .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1962, 109 (02) :141-144
[79]   IMPORTANCE OF THE EMITTER IN THIN BACK-SURFACE FIELD SOLAR-CELLS [J].
MEHTA, SK ;
JAIN, SC .
SOLAR CELLS, 1983, 8 (04) :337-353
[80]  
Mertens R. P., 1981, ADV ELECTRONICS ELEC, V55, P77