EDGE-EFFECTS CORRECTION IN DEPTH PROFILES OBTAINED BY ION-BEAM SPUTTERING

被引:13
作者
TSONG, IST
POWER, GL
HOFFMAN, DW
MAGEE, CW
机构
[1] FORD MOTOR CO,DEARBORN,MI 48121
[2] RCA LABS,PRINCETON,NJ 08540
来源
NUCLEAR INSTRUMENTS & METHODS | 1980年 / 168卷 / 1-3期
关键词
D O I
10.1016/0029-554X(80)91283-5
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:399 / 404
页数:6
相关论文
共 14 条
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[13]   HYDROGEN AND FLUORINE PROFILES IN GDF3 FILMS MEASURED BY SPUTTER-INDUCED OPTICAL EMISSION [J].
TSONG, IST ;
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APPLIED PHYSICS LETTERS, 1978, 32 (06) :381-383
[14]   SIMPLE ELECTRONIC APERTURE FOR RASTERED-BEAM DEPTH PROFILES [J].
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