DEGRADED INGAASP/INP DOUBLE HETEROSTRUCTURE LASER OBSERVATION WITH ELECTRON-PROBE MICROANALYZER

被引：14

作者：

SEKI, M

FUKUDA, M

WAKITA, K

机构：

来源：

APPLIED PHYSICS LETTERS | 1982年 / 40卷 / 02期

关键词：

D O I：

10.1063/1.93027

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：115 / 117

页数：3

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[7] LASING CHARACTERISTICS IN A DEGRADED GAAS-ALXGA1-XAS DOUBLE HETEROSTRUCTURE LASER
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