DETERMINATION OF DENSITY AND CAPTURE CROSS-SECTION OF SURFACE FINISHES WITH SURFACE-CHARGE PUMP EFFECT

被引：8

作者：

KADEN, G ^{[1
]}

REIMER, H ^{[1
]}

机构：

[1] VVB BAUELEMENTE & VAKUUMTECH BERLIN,BERLIN,GER DEM REP

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1977年 / 44卷 / 02期

关键词：

D O I：

10.1002/pssa.2210440251

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K117 / &

共 8 条

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FITZGERALD, DJ .

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[5] SURFACE STATE DENSITY IN MDS STRUCTURES WITH EXTERNAL SOURCE OF MINORITY-CARRIERS [J].

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REIMER, H .

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1975, 32 (01) :183-194

[6]

KADEN G, UNPUBLISHED

[7] A QUASI-STATIC TECHNIQUE FOR MOS C-V AND SURFACE STATE MEASUREMENTS [J].

KUHN, M .

SOLID-STATE ELECTRONICS, 1970, 13 (06) :873-+

[8] SI-SIO2 INTERFACE - ELECTRICAL PROPERTIES AS DETERMINED BY METAL-INSULATOR-SILICON CONDUCTANCE TECHNIQUE [J].

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GOETZBER.A .

BELL SYSTEM TECHNICAL JOURNAL, 1967, 46 (06) :1055-+

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