2-WAVELENGTH SPECKLE INTERFEROMETRY ON ROUGH SURFACES USING A MODE HOPPING DIODE-LASER

被引：8

作者：

FERCHER, AF

VRY, U

WERNER, W

机构：

[1] CARL ZEISS COMP, D-7082 OBERKOCHEN, GERMANY

[2] SPINDLER & HOYER COMP, D-3400 GOTTINGEN, GERMANY

来源：

OPTICS AND LASERS IN ENGINEERING | 1989年 / 11卷 / 04期

关键词：

D O I：

10.1016/0143-8166(89)90065-1

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：271 / 279

页数：9

共 19 条

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[4]

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[8] 2-WAVELENGTH SCANNING SPOT INTERFEROMETER USING SINGLE-FREQUENCY DIODE-LASERS [J].

DENBOEF, AJ .

APPLIED OPTICS, 1988, 27 (02) :306-311

[9] ROUGH-SURFACE INTERFEROMETRY WITH A 2-WAVELENGTH HETERODYNE SPECKLE INTERFEROMETER [J].

FERCHER, AF ;

HU, HZ ;

VRY, U .

APPLIED OPTICS, 1985, 24 (14) :2181-2188

[10] 2-WAVELENGTH SPECKLE INTERFEROMETRIC-TECHNIQUE FOR ROUGH-SURFACE CONTOUR MEASUREMENT [J].

FERCHER, AF ;

VRY, U .

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