PATTERNING AND OVERGROWTH OF NANOSTRUCTURE QUANTUM-WELL WIRE ARRAYS BY LP-MOVPE

被引:18
作者
KARAM, NH
MASTROVITO, A
HAVEN, V
ISMAIL, K
PENNYCOOK, S
SMITH, HI
机构
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
[2] OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
[3] MIT,DEPT ELECT & COMP SCI,CAMBRIDGE,MA 02139
关键词
D O I
10.1016/0022-0248(91)90526-B
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Nanometer scale GaAs quantum well wire (QWW) arrays with lateral dimensions in the range of 10-70 nm and a period of 200 nm have been fabricated in the GaAs/AlGaAs system using X-ray nanolithography patterning and overgrowth by a low pressure metalorganic vapor phase epitaxy (LP-MOVPE) technique. The QWW structures were either fabricated by post-growth patterning of a thin GaAs film on a AlGaAs-coated substrate followed by AlGaAs deposition, or by continuous in-situ deposition of a GaAs/AlGaAs QWW structure on a prepatterned GaAs substrate. Although cross-sectional transmission electron microscopy showed no structural defects in either QWW fabrication process, photoluminescence (PL) was only observed in the in-situ-deposited structures. Strong polarization dependence of the PL peak withrespect to wire orientation has been confirmed and evidence of lateral confinement was observed.
引用
收藏
页码:591 / 597
页数:7
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