THE ELECTRICAL AND PHOTO-VOLTAIC PROPERTIES OF TUNNEL METAL-OXIDE-SEMICONDUCTOR DEVICES BUILT ON N-INP SUBSTRATES

被引:31
作者
PANDE, KP [1 ]
SHEN, CC [1 ]
机构
[1] RUTGERS STATE UNIV,DEPT ELECT ENGN,PISCATAWAY,NJ 08854
关键词
D O I
10.1063/1.329941
中图分类号
O59 [应用物理学];
学科分类号
摘要
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页码:749 / 753
页数:5
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共 28 条
[1]   ELECTRICAL CHARACTERISTICS OF GAAS MIS SCHOTTKY DIODES [J].
ASHOK, S ;
BORREGO, JM ;
GUTMANN, RJ .
SOLID-STATE ELECTRONICS, 1979, 22 (07) :621-631
[2]   STUDIES OF TUNNEL MOS DIODES .1. INTERFACE EFFECTS IN SILICON SCHOTTKY DIODES [J].
CARD, HC ;
RHODERICK, EH .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (10) :1589-+
[3]   PHOTOVOLTAIC PROPERTIES OF MIS-SCHOTTKY BARRIERS [J].
CARD, HC .
SOLID-STATE ELECTRONICS, 1977, 20 (12) :971-976
[4]   SURFACE STATES AND BARRIER HEIGHT OF METAL-SEMICONDUCTOR SYSTEMS [J].
COWLEY, AM ;
SZE, SM .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (10) :3212-&
[5]   METAL-INSULATOR-SEMICONDUCTOR SOLAR-CELLS - THEORY AND EXPERIMENTAL RESULTS [J].
FONASH, SJ .
THIN SOLID FILMS, 1976, 36 (02) :387-392
[6]   A COMPARISON OF PD SCHOTTKY CONTACTS ON INP, GAAS AND SI [J].
HOKELEK, E ;
ROBINSON, GY .
SOLID-STATE ELECTRONICS, 1981, 24 (02) :99-103
[7]  
IMAI Y, 1981, ELECTRON DEVIC LETT, V2, P67
[8]   PROPERTIES OF SCHOTTKY BARRIERS ON P-TYPE INDIUM-PHOSPHIDE [J].
KAMIMURA, K ;
SUZUKI, T ;
KUNIOKA, A .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (11) :L695-L698
[9]   INP METAL-INSULATED-SEMICONDUCTOR SCHOTTKY CONTACTS USING SURFACE OXIDE LAYERS PREPARED WITH BROMINE WATER [J].
KAMIMURA, K ;
SUZUKI, T ;
KUNIOKA, A .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (09) :4905-4907
[10]   MINORITY-CARRIER DIFFUSION LENGTH MEASUREMENTS IN CDTE BY A PHOTOCURRENT TECHNIQUE [J].
LASTRASMARTINEZ, A ;
RACCAH, PM ;
TRIBOULET, R .
APPLIED PHYSICS LETTERS, 1980, 36 (06) :469-471