FIELD-RETARDED DIFFUSION OF ANTIMONY IN GERMANIUM

被引:11
作者
FA, C
ZULEEG, R
机构
关键词
D O I
10.1016/0038-1101(61)90075-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:18 / &
相关论文
共 9 条
[1]   EVALUATION OF THE SURFACE CONCENTRATION OF DIFFUSED LAYERS IN SILICON [J].
BACKENSTOSS, G .
BELL SYSTEM TECHNICAL JOURNAL, 1958, 37 (03) :699-710
[2]  
BLAKESLEE AE, 1960, MAY EL SOC M CHIC
[3]   DIFFUSION OF GALLIUM IN SILICON [J].
KURTZ, AD ;
GRAVEL, CL .
JOURNAL OF APPLIED PHYSICS, 1958, 29 (10) :1456-1459
[4]   DIFFUSION OF BORON INTO SILICON [J].
KURTZ, AD ;
YEE, R .
JOURNAL OF APPLIED PHYSICS, 1960, 31 (02) :303-305
[5]   INTERACTION BETWEEN ARSENIC AND ALUMINUM IN GERMANIUM [J].
MCCALDIN, JO .
JOURNAL OF APPLIED PHYSICS, 1960, 31 (01) :89-94
[6]  
Rahaman M.N., 2003, ANN PHYS-BERLIN, V2nd, DOI [DOI 10.1002/ANDP.18551700105, 10.1201/9781315274126]
[7]   CHEMICAL INTERACTIONS AMONG DEFECTS IN GERMANIUM AND SILICON [J].
REISS, H ;
FULLER, CS ;
MORIN, FJ .
BELL SYSTEM TECHNICAL JOURNAL, 1956, 35 (03) :535-636
[8]   FORMATION OF JUNCTION STRUCTURES BY SOLID-STATE DIFFUSION [J].
SMITS, FM .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1958, 46 (06) :1049-1061
[9]   AN ANALYSIS OF DIFFUSION IN SEMICONDUCTORS [J].
ZAROMB, S .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1957, 1 (01) :57-61