OPTICAL-CONSTANTS OF CUINSE2 AND CUINTE2

被引：12

作者：

LOSCHKE, K

NEUMANN, H

TOMLINSON, RD

HORIG, W

ELLIOTT, E

AVGERINOS, N

HOWARTH, L

机构：

[1] KARL MARX UNIV,SEKT PHYS,DDR-701 LEIPZIG,GER DEM REP

[2] UNIV SALFORD,DEPT ELECT ENGN,SALFORD M5 4WT,LANCASHIRE,ENGLAND

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1980年 / 61卷 / 01期

关键词：

D O I：

10.1002/pssa.2210610149

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K39 / K41

页数：3

共 10 条

[1]

Azzam RMA, 1977, ELLIPSOMETRY POLARIZ

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[3] OPTICAL-PROPERTIES OF CUINSE2 THIN-FILMS [J].

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[4]

HORIG W, UNPUBLISHED

[5] APPLICABILITY OF MULTIPLE ANGLE OF INCIDENCE ELLIPSOMETRY (MAI) - MEASUREMENTS TO GAAS ANODIC OXIDE AND GAP ANODIC OXIDE SYSTEMS AT WAVELENGTH 632.8 NM [J].

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[6] GROWTH AND OPTICAL-PROPERTIES OF CUGATE2 THIN-FILMS [J].

NEUMANN, H ;

HORIG, W ;

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KUHN, G .

THIN SOLID FILMS, 1979, 61 (01) :13-22

[7] ELLIPSOMETRIC STUDIES OF POLISHED SILICON SURFACES [J].

OHLIDAL, M ;

OHLIDAL, I ;

LUKES, F .

SURFACE SCIENCE, 1976, 55 (02) :467-476

[8] INFLUENCE OF IMPURITIES AND FREE-CARRIERS ON THE OPTICAL-PROPERTIES OF CUINSE2 [J].

SOBOTTA, H ;

NEUMANN, H ;

RIEDE, V ;

KUHN, G ;

SELTMANN, J ;

OPPERMANN, D .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 60 (02) :531-537

[9]

TOMLINSON RD, UNPUBLISHED

[10] CHARACTERIZATION OF DEFECTS IN REAL SURFACES BY ELLIPSOMETRY [J].

VEDAM, K .

SURFACE SCIENCE, 1976, 56 (01) :221-236

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