THE VERSAILLES PROJECT ON ADVANCED MATERIALS AND STANDARDS (VAMAS) PROJECT ON ION-IMPLANTED REFERENCE MATERIALS FOR SURFACE-ANALYSIS - SEPTEMBER 1988

被引:11
作者
GRIES, WH
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 03期
关键词
D O I
10.1116/1.576063
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
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页码:1639 / 1640
页数:2
相关论文
共 6 条
[1]   QUANTITATIVE ION-IMPLANTATION - THEORETICAL ASPECTS [J].
GRIES, WH .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1979, 30 (02) :97-112
[2]   AN EVALUATION OF THE CAPABILITIES OF PHOTON AND ELECTRON SPECTROSCOPIES FOR NONDESTRUCTIVE QUANTITATIVE MEASUREMENTS ON ANALYTE DEPTH PROFILES BY THE ANGLE-RESOLVED SIGNAL RATIO METHOD [J].
GRIES, WH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03) :1655-1662
[3]   QUANTITATIVE ION-IMPLANTATION - PRACTICE [J].
GRIES, WH .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1979, 30 (02) :113-125
[4]  
GRIES WH, IN PRESS
[5]   THE DEVELOPMENT OF STANDARDS FOR SURFACE-ANALYSIS [J].
POWELL, CJ .
SURFACE AND INTERFACE ANALYSIS, 1988, 11 (1-2) :103-109
[6]   SIMS ANALYSIS OF ISOTOPIC IMPURITIES IN ION IMPLANTS [J].
SYKES, DE ;
BLUNT, RT .
VACUUM, 1986, 36 (11-12) :1001-1003