Epitaxial YBa2Cu3O7-delta and ZrO2 thin films were deposited by laser ablation on sapphire (1102BAR) substrates. Layers with a zero-resistance temperature T(z) of 89.5 K and a critical current density J(c)(77 K) of 1.5 X 10(6) A cm-2 were created. The droplet density on the film surface was lower than 10(4) cm-2. The microwave surface resistance R(s) (77 K) = 2.4 mOMEGA for f = 8 GHz was measured. (Y-Ba-Cu-O) -ZrO2-sapphire interfaces were studied by Auger spectroscopy and high resolution transmission electron microscopy.