INTERFACE CHARACTERISTICS OF GE3N4-(N-TYPE) GAAS MIS DEVICES

被引:12
作者
PANDE, KP
CHEN, ML
YOUSUF, M
LALEVIC, B
机构
关键词
D O I
10.1016/0038-1101(81)90177-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1107 / 1109
页数:3
相关论文
共 19 条
[1]  
BAYRAKTAROGLU B, 1980, PHYSICS MOS INSULATO, P207
[2]  
BAYRAKTAROGLU B, 1979, C SERIES I PHYSICS, V50, P280
[3]   PLASMA ANODIZATION OF GAAS IN A DC DISCHARGE [J].
CHESLER, LA ;
ROBINSON, GY .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (04) :1525-1529
[4]   SURFACE STATES AND INSULATOR TRAPS AT SI3N4-GAAS INTERFACE [J].
COOPER, JA ;
SCHWARTZ, RJ ;
WARD, ER .
SOLID-STATE ELECTRONICS, 1972, 15 (11) :1219-+
[5]   THE ELECTRON TRAP MECHANISM OF LUMINESCENCE IN SULPHIDE AND SILICATE PHOSPHORS [J].
GARLICK, GFJ ;
GIBSON, AF .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1948, 60 (342) :574-590
[6]  
HARIU T, 1978, APPL PHYS LETT, V32, P253
[7]  
HARTNAGEL HL, 1978, P EUROPEAN SOLID STA
[8]   EFFECTS OF OXIDE TRAPS ON MOS CAPACITANCE [J].
HEIMAN, FP ;
WARFIELD, G .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1965, ED12 (04) :167-&
[9]   MIS STRUCTURES BASED ON SPIN-ON SIO2 ON GAAS [J].
MA, TP ;
MIYAUCHI, K .
APPLIED PHYSICS LETTERS, 1979, 34 (01) :88-90
[10]   ELECTRICAL-PROPERTIES OF GALLIUM ARSENIDE-INSULATOR INTERFACE [J].
MEINERS, LG .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (04) :1402-1407