OBSERVATION OF IN ANTISITE AND FE-RELATED DEFECTS IN 30-MEV ELECTRON-IRRADIATED FE-DOPED SEMIINSULATING INP

被引:13
作者
KURIYAMA, K
SAKAI, K
OKADA, M
YOKOYAMA, K
机构
[1] HOSEI UNIV,ION BEAM TECHNOL RES CTR,KOGANEI,TOKYO 184,JAPAN
[2] KYOTO UNIV,INST RES REACTOR,KUMATORI,OSAKA 59004,JAPAN
[3] JAPAN ENERGY,ELECTR MAT & COMPONENTS LAB,TODA,SAITAMA 335,JAPAN
来源
PHYSICAL REVIEW B | 1995年 / 52卷 / 20期
关键词
D O I
10.1103/PhysRevB.52.14578
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Photoluminescence (PL) spectra are reported and assigned to the Inp antisite in undoped and Fe-doped semi-insulating InP which was irradiated by 30-MeV electrons. In Fe-doped samples, the two PL emissions are at 30 and 117 meV above the valence band, and annihilate in an annealing stage from 300 to 350 degrees C. In-p defects in undoped samples are similar to 10(2) times smaller than those produced in Fe-doped InP. In Fe-doped samples, an emission is also observed near an emission relating to the deep In-p level. The produced defect is suggested to be a complex defect consisting of an iron impurity and an electron-irradiation-induced phosphorous vacancy.
引用
收藏
页码:14578 / 14581
页数:4
相关论文
共 21 条
  • [1] MICROHARDNESS STUDIES OF DOPED AND UNDOPED INP CRYSTALS
    ARIVUOLI, D
    FORNARI, R
    KUMAR, J
    [J]. JOURNAL OF MATERIALS SCIENCE LETTERS, 1991, 10 (10) : 559 - 561
  • [2] BOURGONIN JC, 1989, J APPL PHYS, V64, pR65
  • [3] DEIRI M, 1984, J PHYS C SOLID STATE, V17, pL793, DOI 10.1088/0022-3719/17/29/007
  • [4] ENTHALPY OF FORMATION OF ANTISITE DEFECTS AND ANTISTRUCTURE PAIRS IN III-V COMPOUND SEMICONDUCTORS
    DOBSON, TW
    WAGER, JF
    [J]. JOURNAL OF APPLIED PHYSICS, 1989, 66 (05) : 1997 - 2001
  • [5] EAVES L, 1991, J APPL PHYS, V53, P4955
  • [6] OPTOELECTRONIC INTEGRATED-CIRCUITS
    FORREST, SR
    [J]. PROCEEDINGS OF THE IEEE, 1987, 75 (11) : 1488 - 1497
  • [7] DIFFUSION IN COMPOUND SEMICONDUCTORS
    GOLDSTEIN, B
    [J]. PHYSICAL REVIEW, 1961, 121 (05): : 1305 - &
  • [8] GROTE N, 1986, IOP C P, V79, P583
  • [9] ANNEALING OF UNDOPED INP AND THE EVALUATION BY PHOTOLUMINESCENCE
    INOUE, T
    SHIMAKURA, H
    KAINOSHO, K
    HIRANO, R
    ODA, O
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1990, 137 (04) : 1283 - 1288
  • [10] DETERMINATION OF THE PIN ANTISITE STRUCTURE IN INP BY OPTICALLY DETECTED ELECTRON-NUCLEAR DOUBLE-RESONANCE
    JEON, DY
    GISLASON, HP
    DONEGAN, JF
    WATKINS, GD
    [J]. PHYSICAL REVIEW B, 1987, 36 (02): : 1324 - 1327